Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Nafis Iqbal"'
Autor:
Alan J. Curran, Xuanji Yu, Jiqi Liu, Dylan J. Colvin, Nafis Iqbal, Thomas Moran, Brent Brownell, Mengjie Li, Kristopher O. Davis, Bryan D. Huey, Jean-Nicolas Jaubert, Jennifer L. Braid, Laura S. Bruckman, Roger H. French
Publikováno v:
Frontiers in Energy Research, Vol 11 (2023)
We have studied the degradation of both full-sized modules and minimodules with PERC and Al-BSF cell variations in fields while considering packaging strategies. We demonstrate the implementations of data-driven tools to analyze large numbers of modu
Externí odkaz:
https://doaj.org/article/946333b96385473696d291366884c525
Autor:
Dylan J. Colvin, Nafis Iqbal, Julian H. Yerger, Fang Li, Archana Sinha, Galya Vicnansky, Gabriele Brummer, Nancy Zheng, Eric J. Schneller, James Barkaszi, GovindaSamy TamizhMani, Kristopher O. Davis
Publikováno v:
IEEE Journal of Photovoltaics. 13:275-282
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a62dacee833cf5d8b9c5383368095506
https://doi.org/10.1109/jphotov.2023.3238278
https://doi.org/10.1109/jphotov.2023.3238278
Autor:
Joseph Karas, Benjamin Phua, Alvin Mo, Nafis Iqbal, Kristopher Davis, Stuart Bowden, Alison Lennon, André Augusto
Publikováno v:
ACS Applied Materials & Interfaces. 14:12149-12155
Plated copper (Cu) contacts for silicon (Si) solar cells are an attractive alternative material to conventional screenprinted silver, but there are unresolved questions on the long-term integrity of plated contact structures. In this work, we perform
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0eaf8b16244a00cfcc7476bbaa883ca
https://doi.org/10.1021/acsami.1c21218
https://doi.org/10.1021/acsami.1c21218
Autor:
Nafis Iqbal, Parag Banerjee, Kristopher O. Davis, Jeya Prakash Ganesan, Andrew K. Dickerson, Milos Krsmanovic, Fernand Torres-Davila, Laurene Tetard
Publikováno v:
IEEE Journal of Photovoltaics. 12:230-237
A multicrystalline silicon solar cell was analyzed using Raman microspectroscopy. We measured the prominent Raman modes of silicon, nanocrystalline silicon and silver oxide in various regions of the solar cell to generate insights into the process an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a433f6c51e4fb1eaadc0d0bfee9d939a
https://doi.org/10.1109/jphotov.2021.3126106
https://doi.org/10.1109/jphotov.2021.3126106
Autor:
Jean-Nicolas Jaubert, Dylan J. Colvin, Parag Banerjee, Bryan D. Huey, Alan J. Curran, Andrew G. Norman, Jeya Prakash Ganesan, Dana B. Sulas-Kern, Roger H. French, Kristopher O. Davis, Steven P. Harvey, Fang Li, Nafis Iqbal, GovindaSamy TamizhMani, Joseph Karas
Publikováno v:
IEEE Journal of Photovoltaics. 12:62-72
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c7e50d4afdf4db2e4aa908bc09229da
https://doi.org/10.1109/jphotov.2021.3124751
https://doi.org/10.1109/jphotov.2021.3124751
Autor:
Colvin, Dylan J, Nafis Iqbal, Balaaswhin Babu, Udit Kumar, Neal, Craig J, Seal, Sudipta, Liggett, Max, Jannatul Ferdous Mousumi, Sulas-Kern, Dana B, Jordan, Dirk C, Bruckman, Laura S, Martin, Ina T, French, Roger H, Davis, Kristopher O
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8c8ac487767a48a3e6422501a9cf75a1
Autor:
GovindaSamy TamizhMani, Fang Li, Nafis Iqbal, Eric Schneller, Viswa Sai Pavan Buddha, Kristopher O. Davis, Dylan J. Colvin
Publikováno v:
IEEE Journal of Photovoltaics. 11:926-935
The ultraviolet fluorescence (UVF) imaging method has been widely used as a rapid and economic field inspection tool for investigating encapsulant discoloration of field-aged photovoltaic (PV) modules. In field-aged PV modules, encapsulant discolorat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff788bd1622f38b3ff1dcde243efa367
https://doi.org/10.1109/jphotov.2021.3075865
https://doi.org/10.1109/jphotov.2021.3075865
Autor:
Nafis Iqbal, Nitin K. Chockalingam, Kehley A. Coleman, Jeffrie Fina, Kristopher O. Davis, Laura S. Bruckman, Ina T. Martin
Publikováno v:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b953f7eedfdd5791be6ed92901101128
https://doi.org/10.1109/pvsc48317.2022.9938492
https://doi.org/10.1109/pvsc48317.2022.9938492
Autor:
Xuli Lin, Titel Jurca, Kristopher O. Davis, Nafis Iqbal, Thomas E. Shaw, Nicole Karam Pannaci, Christian Avalos, Zhihao Yang, Mengjie Li
Publikováno v:
IEEE Journal of Photovoltaics. 10:1277-1282
Reliable characterization techniques to accurately quantify the metallization-induced recombination losses as well as contact resistivity losses of screen-printed cells are crucial for successful optimization of the contact grid design. Previously, t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d34974f2b17f2e347b1ba283625c035
https://doi.org/10.1109/jphotov.2020.3003792
https://doi.org/10.1109/jphotov.2020.3003792