Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Nabil Chouba"'
Autor:
Laroussi Bouzaida, Nabil Chouba
Publikováno v:
5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era.
This paper presents a Built In Self Test (BIST) technique for sigma delta ADC testing. The proposed solution consists in a mostly digital module, using a binary stream as test stimulus and sine wave fitting algorithm to estimate Signal-to-Noise and D
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b26eaa04d62a97f1686f4ddb094b6e80
https://doi.org/10.1109/dtis.2010.5487558
https://doi.org/10.1109/dtis.2010.5487558
Publikováno v:
2009 6th International Multi-Conference on Systems, Signals and Devices.
The test of Analogue and Mixed-Signal (AMS) cores requires the use of expensive AMS testers and accessibility to internal analogue nodes. The test cost can be considerably reduced by the use of Built-In-Self-Test (BIST) techniques. One of these techn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9155a27d2796eebc29228fb622fa6b90
https://doi.org/10.1109/ssd.2009.4956815
https://doi.org/10.1109/ssd.2009.4956815