Designing Reliable Cyber-Physical Systems

Autor: Aleksandrowicz, Gadi, Arbel, Eli, Bloem, Roderick, ter Braak, Timon D., Devadze, Sergei, Fey, Goerschwin, Jenihhin, Maksim, Jutman, Artur, Kerkhoff, Hans G., Könighofer, Robert, Koyfman, Shlomit, Malburg, Jan, Moran, Shiri, Raik, Jaan, Rauwerda, Gerard, Riener, Heinz, Röck, Franz, Shibin, Konstantin, Sunesen, Kim, Wan, Jinbo, Zhao, Yong, Wille, Robert, Fummi, Franco

Publikováno v: Lecture Notes in Electrical Engineering
Lecture Notes in Electrical Engineering ISBN: 9783319629193
Lecture Notes in Electrical Engineering-Languages, Design Methods, and Tools for Electronic System Design
Languages, Design Methods, and Tools for Electronic System Design-Selected Contributions from FDL 2016, 15-38
STARTPAGE=15;ENDPAGE=38;TITLE=Languages, Design Methods, and Tools for Electronic System Design-Selected Contributions from FDL 2016

Cyber-physical systems, that consist of a cyber part—a computing system—and a physical part—the system in the physical environment—as well as the respective interfaces between those parts, are omnipresent in our daily lives. The application i

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94dff17fdabcf2ac6b9e835f3ce8370b
https://elib.dlr.de/115773/

Optimal NBTI degradation and PVT variation resistant device sizing in a full adder cell

Autor: Zia Abbas, Usman Khalid, Mauro Olivieri, Michael Pronath, Andreas Ripp

Aging phenomena, on top of process variations along with temperature and supply voltage variations, translate into complex degradation effects on the required performance and yield of nanoscale circuits. The proposed paper focuses on the development

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2a09797db9bf2edab52b9a05e65f294d
http://hdl.handle.net/11573/851860

Aging analysis of circuit timing considering NBTI and HCI

Autor: Georg Georgakos, Dominik Lorenz, Ulf Schlichtmann

Publikováno v: IOLTS

We present an aging analysis flow able to calculate the degraded circuit timing. To the best of our knowledge it is the first approach on gate level so far capable of analyzing the impact of the two dominant drift-related aging effects - NBTI and HCI

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66bb1e20c51ada573a1d02844c9f6cdd
https://mediatum.ub.tum.de/821642

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