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pro vyhledávání: '"N.S. Boltovets"'
Секция 6. Современное оборудование и технологии С помощью метода диффузного рассеяния рентгеновских лучей изучены структурные дефекты,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1594::f6daa3e5080c6da402361e0187236419
http://elib.bsu.by/handle/123456789/182290
http://elib.bsu.by/handle/123456789/182290
Autor:
N.S. Boltovets, V. A. Krivutsa, A. S. Slepova, V. F. Mitin, S. V. Novitskii, A. A. Kozlovskii, V. V. Kholevchuk, A. V. Semenov
Publikováno v:
Review of Scientific Instruments. 89:025004
We developed a heat-sensitive material based on nanocrystalline SiC films obtained by direct deposition of carbon and silicon ions onto sapphire substrates. These SiC films can be used for resistance thermometers operating in the 2 K-300 K temperatur
Autor:
V.F. Mitin, V. V. Kholevchuk, E.V. Mitin, V.V. Basanets, P.C. McDonald, N.S. Boltovets, F. Pavese
Publikováno v:
Cryogenics. 48:413-416
Dual function sensors (DFSs) for concurrent measurement of temperature and magnetic field in cryogenic applications have been developed and characterized. The DFS consists of a Ge-on-GaAs film resistance thermometer and an InSb-on-GaAs film Hall-effe
Autor:
Vitalii K. Dugaev, R. V. Konakova, V. V. Kholevchuk, P.V. Sorokin, I. Yu. Nemish, V.V. Basanets, P.C. McDonald, V.F. Mitin, N.S. Boltovets, E.V. Mitin, E. F. Venger, F. Pavese
Publikováno v:
Cryogenics. 47:474-482
Our paper discusses and reviews the properties of a range of semiconductor sensors, which have been developed for thermometry in cryogenic applications. The range of sensors developed includes a family of single and dual element resistance thermomete
Autor:
N.S. Boltovets
Publikováno v:
Semiconductor Physics, Quantum Electronics and Optoelectronics. 5:183-187
Autor:
N.S. Boltovets
Publikováno v:
Semiconductor Physics, Quantum Electronics and Optoelectronics. 4:318-322
Publikováno v:
Sensors and Actuators A: Physical. 92:191-196
New types of miniature (1.2 mm diameter×1.0 mm long) temperature sensors based on germanium (Ge) films and silicon diodes have been developed and produced. The Ge-film microthermometers are intended for use at temperatures from 1 to 400 K, and silic
Autor:
N.S. Boltovets
Publikováno v:
Semiconductor Physics, Quantum Electronics and Optoelectronics. 4:93-105
Autor:
Petr M. Lytvyn, R. V. Konakova, N.S. Boltovets, I. V. Prokopenko, O. S. Lytvyn, V. V. Milenin, D.I. Voitsikhovskyi, E. F. Venger, N.L. Dmitruk, I. B. Ermolovich, V. N. Ivanov
Publikováno v:
Applied Surface Science. 166:520-525
We present the results of structural, analytical, optical and electrophysical investigations of TiB x –GaAs contacts. They were obtained by magnetron sputtering from pressed powder targets and were studied before and after rapid (60 s) thermal anne
Autor:
N.S. Boltovets
Publikováno v:
Semiconductor Physics, Quantum Electronics and Optoelectronics. 3:352-358