Zobrazeno 1 - 10
of 114
pro vyhledávání: '"N. Rouag"'
Publikováno v:
Trauma Case Reports, Vol 21, Iss , Pp - (2019)
We report the case of retro-lunar dislocation of carpal bones detaching the proximal pole of the capitate with intact scaphoid, associated with lunate fracture. A rare case where the pathomechanics of the lesion has not yet been precisely identified.
Externí odkaz:
https://doaj.org/article/f135a7a9f3494031bbf70482a839cb23
Publikováno v:
Arabian Journal for Science and Engineering. 47:6605-6616
Publikováno v:
Coatings, Vol 11, Iss 1063, p 1063 (2021)
Coatings
Coatings, MDPI, 2021, 11 (9), pp.1063. ⟨10.3390/coatings11091063⟩
Volume 11
Issue 9
Coatings
Coatings, MDPI, 2021, 11 (9), pp.1063. ⟨10.3390/coatings11091063⟩
Volume 11
Issue 9
This paper reports the effect of Silicon substrate orientation and Aluminum nitride buffer layer deposited by molecular beam epitaxy on the growth of aluminum nitride thin films deposited by a DC magnetron sputtering technique at low temperatures. Th
Autor:
Mathias Rommel, T. H. Nouibat, Z. Ouennoughi, D. Chikouch, N. Rouag, Zitouni Messai, Lothar Frey
Publikováno v:
Microelectronics Reliability. 91:183-187
In this paper, the conduction mechanisms in MOS structures are investigated using Normalized Differential Conductance (NDC). It is shown that NDC can be applied successfully for the determination of conduction mechanism parameters in MOS devices. The
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Akademický článek
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Publikováno v:
Trauma Case Reports, Vol 21, Iss, Pp-(2019)
Trauma Case Reports
Trauma Case Reports
We report the case of retro-lunar dislocation of carpal bones detaching the proximal pole of the capitate with intact scaphoid, associated with lunate fracture. A rare case where the pathomechanics of the lesion has not yet been precisely identified.
Publikováno v:
Thin Solid Films
Thin Solid Films, Elsevier, 2018, 655, pp.34-40. ⟨10.1016/j.tsf.2018.03.076⟩
Thin Solid Films, Elsevier, 2018, 655, pp.34-40. ⟨10.1016/j.tsf.2018.03.076⟩
In this work we are interested in analyzing the texture of aluminum nitride thin films deposited by direct-current magnetron sputtering and high-power impulse magnetron sputtering on silicon (100) substrates. The texture characterization of aluminum
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc85d7c6e423f9967a7a6f5d726beecf
https://hal.archives-ouvertes.fr/hal-01848317
https://hal.archives-ouvertes.fr/hal-01848317
Publikováno v:
Microelectronics Reliability. 55:1028-1034
The present work presents an evaluation approach which enables the in-depth analysis of current–voltage ( I – V ) characteristics of MIS devices to determine their current transport mechanisms using a multidimensional minimization system program.