Zobrazeno 1 - 10
of 11
pro vyhledávání: '"N. Robert Sorensen"'
Autor:
Olga Lavrova, Benjamin B. Yang, N. Robert Sorensen, Jason M. Taylor, Bonnie Beth McKenzie, Kenneth M. Armijo, Eric J. Schindelholz
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
Three balance of systems (BOS) connector designs common to industry were investigated as a means of assessing reliability from the perspective of arc fault risk. These connectors were aged in field and laboratory environments and performance data cap
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9adccd048bf8cfe98d09fd62041a26f8
https://doi.org/10.1109/pvsc.2015.7356425
https://doi.org/10.1109/pvsc.2015.7356425
Autor:
Kenneth M. Armijo, N. Robert Sorensen, Richard K. Harrison, Jay Johnson, Benjamin B. Yang, Jason M. Taylor, Kara Elizabeth Thomas
Publikováno v:
2014 IEEE 40th Photovoltaic Specialist Conference (PVSC).
This work investigates balance of systems (BOS) connector reliability from the perspective of arc fault risk. Accelerated tests were performed on connectors for future development of a reliability model. Thousands of hours of damp heat and atmospheri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::184b0e2beacf821ba21a6306430e1bef
https://doi.org/10.1109/pvsc.2014.6924875
https://doi.org/10.1109/pvsc.2014.6924875
Autor:
Alice C. Kilgo, David G. Robinson, Jennifer E. Granata, Benjamin B. Yang, N. Robert Sorensen, Patrick D. Burton, Jason M. Taylor
Publikováno v:
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC).
This paper describes efforts to characterize different aspects of photovoltaic connector reliability. The resistance variation over a population of connections was examined by measuring 75 connectors from three different manufacturers. The comparison
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1fda4d3148382d4cf8cd4edcf2acea38
https://doi.org/10.1109/pvsc.2013.6744115
https://doi.org/10.1109/pvsc.2013.6744115
Publikováno v:
The Journal of Supercritical Fluids. 9:43-50
With the eventual phase-out of chlorofluorocarbons and hydrochlorofluorocarbons, and restrictive regulations concerning the use of other volatile organic compounds as cleaning solvents, it is essential to seek new, environmentally acceptable cleaning
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1eff8b39579899c554950885233daac8
https://doi.org/10.1016/s0896-8446(96)90043-1
https://doi.org/10.1016/s0896-8446(96)90043-1
Publikováno v:
2012 38th IEEE Photovoltaic Specialists Conference.
The reliability, availability and predictability of photovoltaic systems are becoming increasingly important as grid penetration increases and lifetime expectations are raised. Sandia National Laboratories and SunPower Corporation teamed up to implem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb89b9063c823b9590344026ee196c78
https://doi.org/10.1109/pvsc.2012.6317931
https://doi.org/10.1109/pvsc.2012.6317931
Publikováno v:
International Symposium for Testing and Failure Analysis.
Although crystalline silicon PV technology has been in use for more than 30 years, PV has remained a "cottage industry" until the recent expansion. This paper provides an introduction to the issues of reliability in the photovoltaic (PV) field, and t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92cec8c2851f7bc267f910c8d17b3c95
https://doi.org/10.31399/asm.cp.istfa2009p0166
https://doi.org/10.31399/asm.cp.istfa2009p0166
Publikováno v:
SPIE Proceedings.
A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic (PV) systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::279aaa8eca90e8210d77a88b0bc3f171
https://doi.org/10.1117/12.826876
https://doi.org/10.1117/12.826876
Publikováno v:
2009 34th IEEE Photovoltaic Specialists Conference (PVSC).
A program is underway at Sandia National Laboratories1 to predict long-term reliability of photovoltaic systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is bas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77084d6b6d46249fcdbd6badc2f917d6
https://doi.org/10.1109/pvsc.2009.5411140
https://doi.org/10.1109/pvsc.2009.5411140
Autor:
Schindelholz, Eric, Yang, Benjamin B., Armijo, Kenneth M., McKenzie, Bonnie B., Taylor, Jason M., Sorensen, N. Robert, Lavrova, Olga
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC); 2015, p1-6, 6p
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detec
