Zobrazeno 1 - 10
of 184
pro vyhledávání: '"N. Ramadass"'
Autor:
G. Venkatesan, N. Ramadass
Publikováno v:
Computer Systems Science and Engineering. 46:3979-3991
Akademický článek
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Publikováno v:
Procedia Computer Science. 167:205-212
The elevated perplexity in solving non deterministic problems (NP-Hard) has opened the way for the emergence of several metaheuristics. Most of the real time problems pertaining to electronics are Multi-Objective Optimization Problem (MOOP). Hence, t
Publikováno v:
Computational Intelligence and Neuroscience, Vol 2020 (2020)
Computational Intelligence and Neuroscience
Computational Intelligence and Neuroscience
The present work visualizes the evolution of primitive digital circuits as a development problem. The development of the digital circuit is implemented similar to the development of a human embryo from a single cell to the complete organism. The cons
Publikováno v:
Journal of Computational and Theoretical Nanoscience. 14:1521-1523
Autor:
N. Ramadass, Lalin L. Laudis
Publikováno v:
Journal of Circuits, Systems and Computers. 29:2050003
The complexity of any integrated circuit pushes the researchers to optimize the various parameters in the design process. Usually, the Nondeterministic Polynomial problems in the design process of Very Large Scale Integration (VLSI) are considered as
Publikováno v:
The Imaging Science Journal. 57:30-36
In this paper, a novel state-based dynamic multi-alphabet arithmetic coding algorithm which adapts efficiently to the locally occurring symbol statistics is presented. The proposed coding algorithm is applicable to sources such as raw images or trans
Publikováno v:
Journal of Computer Science. 3:823-828
Emerging trends in design of real-time digital signal processing systems indicate that in the future, a significant amount of performance improvement can be achieved using dynamically reconfigurable embedded architectures consisting of reconfigurable
Publikováno v:
Information Technology Journal. 6:66-73
Publikováno v:
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013).
Integrated circuits fabricated in deep sub-micron technology are vulnerable to intermittent or transient faults which are the predominant cause of system failures. With continued scaling, operating voltage levels have reduced and resultant decrease i