Zobrazeno 1 - 6
of 6
pro vyhledávání: '"N. P. Turner"'
Autor:
M. T. Herrera-Abreu, J. Guan, U. Khalid, J. Ning, M. R. Costa, J. Chan, Q. Li, J-P. Fortin, W. R. Wong, P. Perampalam, A. Biton, W. Sandoval, J. Vijay, M. Hafner, R. Cutts, G. Wilson, J. Frankum, T. I. Roumeliotis, J. Alexander, O. Hickman, R. Brough, S. Haider, J. Choudhary, C. J. Lord, A. Swain, C. Metcalfe, N. C. Turner
Publikováno v:
Nature Communications, Vol 15, Iss 1, Pp 1-19 (2024)
Abstract CDK4/6 inhibition in combination with endocrine therapy is the standard of care for estrogen receptor (ER+) breast cancer, and although cytostasis is frequently observed, new treatment strategies that enhance efficacy are required. Here, we
Externí odkaz:
https://doaj.org/article/b017bcff889f48aab6b6f9fbfc965a35
Publikováno v:
Biogeosciences, Vol 13, Iss 2, Pp 527-534 (2016)
Soil organic carbon (SOC) plays a vital role as both a sink for and source of atmospheric carbon. Revegetation of degraded arable land in China is expected to increase soil carbon sequestration, but the role of perennial legumes on soil carbon stocks
Externí odkaz:
https://doaj.org/article/33119d05dcf34930b3533412199db6e9
Publikováno v:
Journal of Lightwave Technology. 8:1259-1268
Seeks to establish a high level of confidence in fiber cladding diameter measurement by the use of three methods: white light interferometry, mechanical contact, and image inverting microscopy. Calibration with transfer fibers is considered unattract
Autor:
N. P. Turner, John Nunn
Publikováno v:
Scanning. 11:213-217
A technique for measuring the widths of lines on chromium-on-glass photomasks is described which combines the resolution of the scanning electron microscope (SEM) with the accuracy of a helium-neon laser interferometer, and the setting sensitivity of
Autor:
M. A. Dillingham, G. L. Fugate, L. H. Earnest, N. P. Turner, F. H. Newnam, F. N. Baldwin, W. K. Van Zandt, C. R. Harvill
Publikováno v:
Journal - American Water Works Association. 46:425-437
A consolidation of papers presented on Oct. 19, 1953, at the Southwest Section Meeting, Houston, Tex., by F. N. Baldwin, Director, Utilities Dept.; G. L. Fugate, Chief Design Engr., San Jacinto Water Supply, Utilities Dept.; C. R. Harvill, Supt., San
Autor:
N. P. Turner, M. J. Downs
Publikováno v:
Microscopy: Techniques and Capabilities.
The problems of making accurate measurements of critical dimensions of features on integrated photomasks and silicon wafers are discussed and the currently employed optical measurement techniques described. Sources of systematic uncertainty in such m