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pro vyhledávání: '"N. P. Pasoz"'
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
The investigation of low losses using EELS has become popular since the last generation of TEMs with monochromators and higher order corrected spectrometers have become more easily accessible. Several examples mainly focusing on semi conductors can b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9323ba74a0d604afbfd52ce6e2afb6e0
https://doi.org/10.1007/978-3-540-85156-1_195
https://doi.org/10.1007/978-3-540-85156-1_195
