Zobrazeno 1 - 2
of 2
pro vyhledávání: '"N. N. Salaschenko"'
Autor:
Emilio Burattini, N. N. Salaschenko, S. I. Zheludeva, A.N. Sosphenov, K. A. Prokhorov, E. A. Shamov, Mikhail V. Kovalchuk, G. Cappuccio, N. N. Novikova
Publikováno v:
Journal of Applied Crystallography. 30:833-838
The analysis of the wavefield intensity distribution connected with X-ray standing wave (XRSW) generation above the mirror surface at total reflection (TR) is presented for a vacuum/film/substrate sample along with experimental examples for organic a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb9a7711ba76aa40d5a6d943e636e5a7
https://doi.org/10.1107/s0021889897001167
https://doi.org/10.1107/s0021889897001167
Autor:
N. N. Salaschenko, I. V. Bashelhanov, M. V. Kovalchuk, N. N. Novikova, S. I. Zheludeva, Yu. Ya. Platonov, A. D. Akhsakhalyan
Publikováno v:
Review of Scientific Instruments. 63:1519-1522
New possibilities of ultrathin film thickness and density determination are demonstrated by means of x‐ray method in the form of x‐ray standing wave technique (XSW) and total external fluorescence study (NTEF). Several samples with ultrathin Fe f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::113ec0287b22a8d6293bba175ffeb657
https://doi.org/10.1063/1.1143010
https://doi.org/10.1063/1.1143010