Zobrazeno 1 - 10
of 37
pro vyhledávání: '"N. N. Salaschenko"'
Autor:
Emilio Burattini, N. N. Salaschenko, S. I. Zheludeva, A.N. Sosphenov, K. A. Prokhorov, E. A. Shamov, Mikhail V. Kovalchuk, G. Cappuccio, N. N. Novikova
Publikováno v:
Journal of Applied Crystallography. 30:833-838
The analysis of the wavefield intensity distribution connected with X-ray standing wave (XRSW) generation above the mirror surface at total reflection (TR) is presented for a vacuum/film/substrate sample along with experimental examples for organic a
Autor:
N. N. Salaschenko, I. V. Bashelhanov, M. V. Kovalchuk, N. N. Novikova, S. I. Zheludeva, Yu. Ya. Platonov, A. D. Akhsakhalyan
Publikováno v:
Review of Scientific Instruments. 63:1519-1522
New possibilities of ultrathin film thickness and density determination are demonstrated by means of x‐ray method in the form of x‐ray standing wave technique (XSW) and total external fluorescence study (NTEF). Several samples with ultrathin Fe f
Publikováno v:
Moscow University Physics Bulletin; Aug2024, Vol. 79 Issue 4, p494-499, 6p
Autor:
Yashiro, Hidehiko, Kakehata, Masayuki
Publikováno v:
Applied Physics Letters; 3/28/2022, Vol. 120 Issue 13, p1-5, 5p
Publikováno v:
Applied Physics A: Materials Science & Processing. Aug2015, Vol. 120 Issue 2, p409-415. 7p. 2 Diagrams, 6 Graphs.
Comparative x-ray reflectometry and atomic force microscopy of surfaces with non-Gaussian roughness.
Publikováno v:
Journal of Applied Physics; Sep2008, Vol. 104 Issue 6, p064301, 7p, 1 Diagram, 1 Chart, 8 Graphs
Autor:
Nosik, V. L.
Publikováno v:
Crystallography Reports. Nov2002, Vol. 47 Issue 6, p925. 9p.
Publikováno v:
Applied Physics A: Materials Science & Processing. 1999, Vol. 69 Issue 3, p353. 6p.
Publikováno v:
Journal of Applied Physics; 4/1/1996, Vol. 79 Issue 7, p3686, 5p, 1 Diagram, 4 Graphs
Autor:
Hudec, René
Publikováno v:
Proceedings of SPIE; 3/26/2023, Vol. 12482, p1257602-1257602, 1p