Zobrazeno 1 - 10
of 71
pro vyhledávání: '"N. Mirchin"'
Publikováno v:
Journal of Materials Science and Chemical Engineering. :30-36
A discrete model of the Differential Evanescent Light Intensity (DELI) technique was developed to calculate and map 3D nanolayers thicknesses from the evanescent light intensity captured from optical waveguides. The model was used for ultra-thin Pd n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c59d78178402a699cd85d1c1b1dbb5b
https://doi.org/10.4236/msce.2015.35004
https://doi.org/10.4236/msce.2015.35004
Autor:
Ion N. Mihailescu, G. Dorcioman, N. Mirchin, Angela Popescu, Liviu Duta, Aaron Peled, J. Azoulay
Publikováno v:
World Journal of Engineering. 11:111-116
TiO2 thin films were deposited by Pulsed Laser Deposition (PLD) on glass substrates at 27°C and 100°C. The extraction efficiency of evanescent light from the deposited nanolayers and their thickness profiles in the range of (1-100) nm was evaluated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dfeaec03d24c7ee07fd5081bd3598789
https://doi.org/10.1260/1708-5284.11.2.111
https://doi.org/10.1260/1708-5284.11.2.111
Publikováno v:
Microscopy Research and Technique. 76:992-996
The extraction efficiency of evanescent light from ZnO nanolayers and their thickness profiles in the range of (1-105) nm was evaluated by a new microscopy technique, differential evanescent light intensity imaging method. It is based on capturing th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9bfa9b702a9efb31caefbbe5b564b7c
https://doi.org/10.1002/jemt.22259
https://doi.org/10.1002/jemt.22259
Publikováno v:
World Journal of Engineering. 10:1-10
A simulation method was developed to display images of nano-particles and their dynamic 2D growth on surfaces, due to mechanisms such as adsorption, diffusion and coalescence. In this method a mathematical Fourier frequency tranforms (FT) of a 2D ima
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6356609fe4a3fadc6b149036891b3eba
https://doi.org/10.1260/1708-5284.10.1.1
https://doi.org/10.1260/1708-5284.10.1.1
Publikováno v:
Materials Sciences and Applications. :572-577
Nanometric profiles of sputtered ultra-thin Pd layers with thicknesses in the range 1 - 10 nm were investigated by capturing the leaking evanescent light from optical waveguides. The Pd films were deposited by sputtering on glass substratesalso servi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b435a68e59df3da521c2689fb459e2a2
https://doi.org/10.4236/msa.2013.49070
https://doi.org/10.4236/msa.2013.49070
Autor:
N. Mirchin, Aaron Peled
Publikováno v:
Journal of Advanced Microscopy Research. 7:26-31
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c45d6720ac264e8e91d00a32a8e6585
https://doi.org/10.1166/jamr.2012.1094
https://doi.org/10.1166/jamr.2012.1094
Autor:
Ion N. Mihailescu, G. Dorcioman, Andrei C. Popescu, Igor Lapsker, Uri Gorodetsky, Aaron Peled, N. Mirchin, V. Fogel, Boris Apter, Liviu Duta, Gianina Popescu-Pelin, Simona Popescu
Publikováno v:
Journal of Nanoscience and Nanotechnology. 12:2668-2671
The evanescent light photon extraction efficiency of insulator, semiconductor and conductor amorphous nanolayers deposited on glass waveguides was evaluated from Differential Evanescent Light Intensity measurements. The Differential Evanescent Light
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::085725828b5178bf9f1ca70daae5642a
https://doi.org/10.1166/jnn.2012.5788
https://doi.org/10.1166/jnn.2012.5788
Autor:
Simona Popescu, G. Dorcioman, Ion N. Mihailescu, Igor Lapsker, N. Mirchin, Uri Gorodetsky, Aaron Peled, Boris Apter, Angela Popescu, Liviu Duta
Publikováno v:
Applied Physics A. 104:997-1002
Nanometer polyethylene (PE) thin films were prepared by Matrix Assisted Pulsed Laser Evaporation (MAPLE). Insulating PE thin films of different thicknesses, below 200 nm, were fabricated by varying the deposition conditions. We then used the Differen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa2f3ce6526ba02909dcf7fb5872f81d
https://doi.org/10.1007/s00339-011-6504-z
https://doi.org/10.1007/s00339-011-6504-z
Differential evanescent light intensity imaging of nanothin films: simulation of the scattered field
Publikováno v:
physica status solidi c. 8:2957-2960
The evanescent optical field scattering simulation of a-Se nanoparticles was obtained by the Maxwell equation solver FullWAVE and correlated to experimental a-Se films nanoprofiles obtained by Differential Evanescent Light Intensity Imaging (DELI). T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::628d2dd424370569d8e71ef87fa3f9ce
https://doi.org/10.1002/pssc.201084042
https://doi.org/10.1002/pssc.201084042
Publikováno v:
Journal of Advanced Microscopy Research. 6:104-108
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5ee28e3f570e2ac3a04d32c1a9b184d
https://doi.org/10.1166/jamr.2011.1062
https://doi.org/10.1166/jamr.2011.1062