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Publikováno v:
Microelectronics Reliability. 42:1353-1358
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0e3fdcea7dd4aa076ff079aaa998aecf
https://doi.org/10.1016/s0026-2714(02)00148-8
https://doi.org/10.1016/s0026-2714(02)00148-8
Publikováno v:
Microelectronics Reliability. 36:1859-1862
This paper presents a new method to isolate process steps causing performance spread of analogue or digital circuits. It is based on the analysis of process control (PC) parameters and can be directly applied to parametric on-wafer test. The suitabil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc9d5e1eb49923c07e40a3c5d7e78e72
https://doi.org/10.1016/0026-2714(96)00215-6
https://doi.org/10.1016/0026-2714(96)00215-6
Publikováno v:
ICCSC'02. 1st IEEE International Conference on Circuits and Systems for Communications. Proceedings (IEEE Cat. No.02EX605).
In this paper, we investigate the phase noise and the jitter in voltage-controlled oscillators. We have developed a VHDL-AMS model of a low power, low noise, multivibrator oscillator. The model includes phase noise effect. Simulation results verify t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b46fed3bb9d9bc34b7770073520a34c
https://doi.org/10.1109/occsc.2002.1029118
https://doi.org/10.1109/occsc.2002.1029118
Publikováno v:
Proceedings. 15th Symposium on Integrated Circuits and Systems Design.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e3ada1df73c1456668cb582757eecb5
https://doi.org/10.1109/sbcci.2002.1137676
https://doi.org/10.1109/sbcci.2002.1137676
Publikováno v:
MSE
This paper describes a new project oriented course which has been set-up recently at the University of Bordeaux, France, in co-operation with the institute of Microelectronics Bordeaux IXL. This course, held within the curriculum of the microelectron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a235add79beaec963d24aa4f9954c0f
https://doi.org/10.1109/mse.1999.787037
https://doi.org/10.1109/mse.1999.787037
Publikováno v:
IEEE 1995 International Integrated Reliability Workshop. Final Report.
An approach which identifies key disturbances which cause bipolar model parametric variations and correlation is presented. Model parameters, expressed as a function of technological data, are analyzed through a straightforward correlation study. Com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d40b7b0e105910758d7c2a7f60274f8
https://doi.org/10.1109/irws.1995.493596
https://doi.org/10.1109/irws.1995.493596
Autor:
N. Milet-Lewis, J.J. Charlot, Herve Levi, Yannick Hervé, G. Monnerie, D. Geoffroy, A. Fakhfakh
Publikováno v:
Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601).
This paper presents a behavioral model library of analogue and mixed circuits used in the radio-frequency domain. The models are described in VHDL-AMS and are carefully documented and validated, in order to be easily used by designers or model develo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::acab79eb6bacce676428ae1cf06f6993
https://doi.org/10.1109/bmas.2001.962490
https://doi.org/10.1109/bmas.2001.962490
Publikováno v:
System on Chip Design Languages ISBN: 9781441952813
Synchronous oscillators are a class of oscillators used in the design of frequency synthesisers due to their good characteristics in term of phase noise and frequency multiplication. A VHDL-AMS synchronous oscillator model has been developed, includi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7119e8b336985ae6ce0956870802d592
https://doi.org/10.1007/978-1-4757-6674-5_4
https://doi.org/10.1007/978-1-4757-6674-5_4
