Study of the ESD behavior of different clamp configurations in a 0.35 μm CMOS technology

Autor: N. Maene, R. Bellens, G. Mabboux, C. Richier

Publikováno v: Microelectronics Reliability. 38:1733-1739

At present, submicron technologies, electrostatic discharges (ESD) are one of the major threats to the reliability of ICs. The aim of this paper is to demonstrate that a very good ESD protection level can be achieved provided we can insure a uniform

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::fcf8d6141e68c8a86a309cd4c256349e
https://doi.org/10.1016/s0026-2714(98)00176-0

Smith-Purcell radiation from electrons moving parallel to a gratingat oblique incidence to the rulings

Autor: J.-M. Salomé, Olivier Haeberlé, N. Maene, P. Rullhusen

Publikováno v: Physical Review E. 55:4675-4683

Smith-Purcell radiation is produced when a charged particle moves parallel and close to a diffraction grating. We extend previous descriptions of the phenomenon by considering a particle moving parallel to the grating surface at an arbitrary angle wi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::fa53f562a3872b4f0e20a51181e2808a
https://doi.org/10.1103/physreve.55.4675

On-chip electrostatic discharge protections in advanced CMOS technologies

Autor: K. Allaert, J. Vandenbroeck, N. Maene

Publikováno v: Microelectronics Reliability. 32:1545-1550

In this paper several on-chip electrostatic discharge (ESD) protections for inputs, outputs and supply pins are discussed. By comparing different structures, insight has been attained in the most important parameters determining the ESD sensitivity,

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::355ffbf0c1b596c952aed000cb136434
https://doi.org/10.1016/0026-2714(92)90454-s

A modular 0.7 mu m CMOS JESSI test chip for multi purpose applications

Autor: N. Maene, H. Richter, J. Hanseler, E. Janssens, T. Brenner, J. le Ber, S. Lindenkreuz, G. Morin

Publikováno v: ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures.

A CMOS 0.7- mu m test chip for technology and model parameter measurements and reliability testing is presented. The basic concept is based on well-defined standardized modules with fixed sizes. It was designed by eight European companies with common

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f96e118ffa46248b11a41695c90b7e11
https://doi.org/10.1109/icmts.1992.185960

Grating transition radiation: a source of quasimonochromatic radiation

Autor: Willy Mondelaers, N. Maene, P. Rullhusen, Olivier Haeberlé, P. Henri

Publikováno v: Physical Review E : Statistical, Nonlinear, and Soft Matter Physics
Physical Review E : Statistical, Nonlinear, and Soft Matter Physics, American Physical Society, 1999, 60 (5), pp.6214-6217. ⟨10.1103/PhysRevE.60.6214⟩

International audience; We have observed transition radiation at optical wavelengths, emitted by 3-13-MeV electrons interacting with a diffraction grating. Near the direction of specular reflection we observed broadband radiation with the same proper

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7439aebbebe20330769eba69a0f747c3
https://pubmed.ncbi.nlm.nih.gov/11970537