Zobrazeno 1 - 10
of 36
pro vyhledávání: '"N. M. Sivamangai"'
Publikováno v:
Journal of Electronic Testing. 38:653-666
Publikováno v:
National Academy Science Letters.
Publikováno v:
Journal of Electronic Testing.
Publikováno v:
2023 International Conference on Intelligent Data Communication Technologies and Internet of Things (IDCIoT).
Publikováno v:
Computer Aided Constellation Management and Communication Satellites ISBN: 9789811985546
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64ba6577c78bf5290b912b45d4a27ba5
https://doi.org/10.1007/978-981-19-8555-3_2
https://doi.org/10.1007/978-981-19-8555-3_2
Publikováno v:
Integration. 81:221-233
The Minimum Variance Distortion less Response (MVDR) beamformer is an attractive alternative to conventional delay and sum (DAS) beamformers in medical ultrasound imaging. However, it is not widely employed in medical ultrasound imaging due to its co
Autor:
P. A., Silpa1 (AUTHOR) silpapulickal@gmail.com, N. M., Sivamangai1 (AUTHOR)
Publikováno v:
Inorganic & Nano-Metal Chemistry. 2020, Vol. 50 Issue 2, p73-79. 7p.
Publikováno v:
Silicon. 14:2863-2869
This work focused on the effects of electroforming ambient temperature and annealing process on the metal oxide multilayer switching resistive random access memory (RRAM) device. We developed Pt/HfO2/TiO2/HfO2/Pt RRAM cells with annealing and without
Autor:
N. M. Sivamangai, Princy Prince
Publikováno v:
Analog Integrated Circuits and Signal Processing. 107:353-367
As technology advances, circuit density and complexity increases in integrated circuits which make the devices vulnerable to different types of manufacturing defects. In such cases, even the occurrence of a fault may be critical. Hence, ensuring Stat
Autor:
Nimmy M Philip, N M Sivamangai
Publikováno v:
2022 6th International Conference on Devices, Circuits and Systems (ICDCS).