Zobrazeno 1 - 10
of 10
pro vyhledávání: '"N. M. Gnuchev"'
Publikováno v:
2020 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech).
The paper presents a study of the phenomenon of low-threshold field electron emission from thin films deposited on doped silicon wafers. The performed experiments have confirmed that Mo islet films (as well as previously studied carbon ones) can yiel
Publikováno v:
Journal of Physics: Conference Series. 1851:012022
Thin-film semiconductor devices and functional metal-oxide-semiconductor structures have drawn attention as being applicable for on-chip electronics. Similar structures, however, were also reported to be promising as efficient sources of electrons. T
Autor:
V.A. Filatov, V. Ye. Babyuk, N. M. Gnuchev, V. S. Osipov, P. G. Gabdullin, Alexander V. Arkhipov, I.S. Bizyaev, O. E. Kvashenkina
Publikováno v:
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech).
Experiments have demonstrated that thin discontinuous Mo films deposited on oxidized Si wafers may possess the capability of low-field electron emission. For different samples with effective thickness 2–6 nm the emission threshold (macroscopic elec
Publikováno v:
Technical Physics Letters. 40:1065-1068
Emission properties of carbon films deposited on silicon substrates by magnetron sputtering have been studied. The structure of the films was varied by changing the substrate temperature. It was found that the best emission properties are obtained fo
Autor:
Alexander V. Arkhipov, E. V. Budylina, N. M. Gnuchev, P. A. Shkitun, P. G. Gabdullin, O. E. Kvashenkina, A. N. Andronov
Publikováno v:
2017 30th International Vacuum Nanoelectronics Conference (IVNC).
Previous experiments have showed that carbon island films (quantum dots) at silicon can be capable of low-field electron emission. This paper presents new results of experiments on comparative characterization of emitting and non-emitting thin carbon
Autor:
Alexander Andronov, Alexander V. Arkhipov, Ekaterina Budylina, P. G. Gabdullin, Pavel Shkitun, O. E. Kvashenkina, N. M. Gnuchev
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 36:02C108
Previous experiments have demonstrated that carbon nanoisland films (or disordered quantum-dot arrays) deposited on silicon wafers may possess the property of low-field electron emission. This paper presents our new work on comparative characterizati
Autor:
N. M. Gnuchev, S. N. Davydov, A. E. Kravchik, V. V. Sokolov, V. V. Korablev, P. G. Gabdullin, V. B. Bondarenko
Publikováno v:
Technical Physics. 49:1360-1363
Powders prepared from nanoporous carbon are promising for creating cold emitters, which are essential to the development of reliable next-generation monitors. The results of an experimental study of the temperature and time dependences of the emissio
Autor:
N. M. Gnuchev, S. N. Davydov, P. G. Gabdullin, Alexandr Kravchik, S. I. Krel, Alexander V. Arkhipov
Publikováno v:
Journal of Nanomaterials, Vol 2014 (2014)
Influence of fabrication technology on field electron emission properties of nanoporous carbon (NPC) was investigated. Samples of NPC derived from different carbides via chlorination at different temperatures demonstrated similar low-field emission a
Autor:
S. I. Krel, D. E. Drobinin, Vera Protopopova, P. G. Gabdullin, Alexander V. Arkhipov, N. M. Gnuchev, Maxim V. Mishin
Publikováno v:
Journal of Nano- and Electronic Physics. 8:02058-1
Autor:
S. N. Davydov, Anton A. Arkhipov, P. G. Gabdullin, N. M. Gnuchev, V. B. Bondarenko, Andrey V. Maslevtsov
Publikováno v:
St. Petersburg Polytechnical University Journal: Physics and Mathematics. (4):306-315
A novel electron spectrometer has been designed to study low-voltage field-induced emission of nanostructures such as nanoporous carbon, nanotubes, nanodiamond and other carbon structures. The estimated high resolving power of the device is mainly ac