Zobrazeno 1 - 5
of 5
pro vyhledávání: '"N. M. Abdullaev"'
Autor:
M. G. Guseinaliyev, N. A. Kasumov, O. R. Akhmedov, N. M. Abdullaev, N. A. Abdullaev, S. S. Babaev
Publikováno v:
Semiconductors. 50:50-53
The complex dielectric function of PbS thin films is studied by spectroscopic ellipsometry in the spectral range from 0.74 to 6.45 eV at a temperature of 293 K. The critical energies are determined to be E1 = 3.53 eV and E2 = 4.57 eV. For both energy
Publikováno v:
Modern Physics Letters B. 34:2050008
The temperature range of [Formula: see text] = 77–770 K in the system alloys: Holl coefficient [Formula: see text], thermo-emf [Formula: see text], electric conductivity [Formula: see text], measured [Formula: see text]-density of components and an
Autor:
I. T. Mamedova, K. M. Mustafayeva, A. M. Kerimova, N. M. Abdullaev, P. O. Bulanchuk, H. V. Aliguliyeva, N. T. Mamedov, N. A. Abdullaev, Sergey A. Nemov
Publikováno v:
Semiconductors. 47:602-605
The conductivity, Hall effect, and magnetoresistance of Bi2(Te0.9Se0.1)3 solid solution thin films are studied in a wide temperature range from 2.5 to 300 K and in high magnetic fields of up to 8 T. It is found that the conductivity of Bi2(Te0.9Se0.1
Autor:
Sergey A. Nemov, Nazim Mamedov, Ayaz Bayramov, S. Sh. Kahramanov, A. M. Kerimova, Kazuki Wakita, N. M. Abdullaev, N. A. Abdullaev, H. Miyamoto
Publikováno v:
Semiconductors. 46:1140-1144
The Bi2(Te0.9Se0.1)3 solid solutions thin films are produced by “hot wall” thermal evaporation in vacuum. From the data of X-ray diffraction studies, atomic-force microscopy of the surface relief, and Raman spectroscopy, it is established that va
Autor:
N. M. Abdullaev, G. S. Mehdiyev, N. A. Abdullaev, Sergey A. Nemov, T. G. Kerimova, H. V. Aliguliyeva
Publikováno v:
Semiconductors. 45:37-42
The temperature dependences (T = 5−300 K) of the resistivity in the plane of layers and in the direction perpendicular to the layers, as well as the Hall effect and the magnetoresistance (H < 80 kOe, T = 0.5−4.2 K) in Bi2Te3 single crystals doped