Zobrazeno 1 - 10
of 25
pro vyhledávání: '"N. L. Michael"'
Autor:
N. L. Michael, Todd E. Ryan, Choong-Un Kim, Liang-Shan Chen, Young-Joon Park, Woong Ho Bang, Sean W. King
Publikováno v:
ECS Transactions. 35:757-771
This paper concerns the new method of detecting the integration failures in porous low-k (PLK)/Cu interconnects using simple voltammetry-based techniques. In essence, the technique takes advantage of the fact that pores in PLK allow permeation of liq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e1001350a24f2471e882c44a03e68d5b
https://doi.org/10.1149/1.3572318
https://doi.org/10.1149/1.3572318
Publikováno v:
Journal of Electronic Materials. 32:982-987
This paper presents a study of electron scattering in damascene-processed Cu interconnects. To understand the leading electron-scattering mechanism responsible for the size effect, Cu interconnects with varying physical widths, 80–750 nm, were made
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::481ac5f5ffc22aed485192e63bde3990
https://doi.org/10.1007/s11664-003-0079-1
https://doi.org/10.1007/s11664-003-0079-1
Publikováno v:
Journal of Electronic Materials. 32:988-993
This paper presents experimental evidence suggesting that electromigration (EM) can be a serious reliability threat when the dimension of Cu interconnects approaches the nanoscale range. To understand the failure mechanism prevailing in nanoscale Cu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::981c2a963a4944b0f0d058b9769604fc
https://doi.org/10.1007/s11664-003-0080-8
https://doi.org/10.1007/s11664-003-0080-8
Autor:
N. L. Michael, Choong-Un Kim
Publikováno v:
Journal of Applied Physics. 90:4370-4376
Electromigration in Cu thin films is studied in a cross-strip configuration. Cu lines with isolated areas of Cu(Al) or Cu(Sn) are tested between 250 and 390 °C with the following results. The hillock and void marker motion indicates that Sn moves in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32d3d72edd067c1c0fd523a1473deae1
https://doi.org/10.1063/1.1406964
https://doi.org/10.1063/1.1406964
Publikováno v:
Review of Scientific Instruments. 72:3962-3967
This article introduces a simple and effective technique for conducting electromigration testing of a number of samples using a single current source. It is based on a configuration where all samples are serially connected to a single current source,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4c0e18da3b2bf556b68fd216e95ee9e
https://doi.org/10.1063/1.1400153
https://doi.org/10.1063/1.1400153
Publikováno v:
Applied Physics Letters. 83:1959-1961
This letter presents evidence of an oxidation-driven failure mechanism in Cu interconnects integrated with ultralow-κ materials. It is found that the open pore structure of ultralow-κ materials allows oxidants in the ambient to reach the interconne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::386b94780bb4feca7b7bfe2e85ed3c61
https://doi.org/10.1063/1.1609242
https://doi.org/10.1063/1.1609242
Autor:
L, Tse, N L, Michael
Publikováno v:
Methods in molecular medicine. 17
RNA transcripts are produced from the 5' long terminal repeat (LTR) of human immunodeficiency virus type-1 (HIV-1) under the complex control of viral regulatory sequences (1-7). The LTR from a prototypical, laboratory-adapted HIV-1 (HXB2) can be divi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::36a3b6fd6e9d3dd461f409085d768bf1
https://pubmed.ncbi.nlm.nih.gov/21380668
https://pubmed.ncbi.nlm.nih.gov/21380668
Autor:
Leigh Anne Eller, Noah Kiwanuka, N. L. Michael, Michael A. Eller, Ronald H. Gray, Maria J. Wawer, David Serwadda, Nelson K. Sewankambo, B. K. Brown, Thomas C. Quinn, M. S. de Souza, M. L. Robb, Peter O. Oballah, Frederick Wabwire-Mangen, Benson J. Ouma, Oliver Laeyendecker, David C. Montefiori, V. R. Polonis
Publikováno v:
Retrovirology, Vol 6, Iss Suppl 3, p P56 (2009)
Retrovirology
Scopus-Elsevier
Retrovirology
Scopus-Elsevier
Open Access Poster presentation P04-28. Breadth and magnitude of neutralizing antibody responses in subjects infected with HIV-1 subtype D or recombinants in Rakai district, Uganda L Eller*1, B Ouma2, P Oballah2, MA Eller1, MS de Souza3, F WabwireMan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e365855e765bcdea02963c9fcc448669
https://doaj.org/article/c996330dd2e4451eb969586cf697c34f
https://doaj.org/article/c996330dd2e4451eb969586cf697c34f
Autor:
Kyu Hwan Oh, Emil H. Zin, N. L. Michael, U. Chul, Choong-Un Kim, Seok Hun Kang, J. S. Cho, J. T. Moon
Publikováno v:
2009 59th Electronic Components and Technology Conference.
This paper presents findings evidencing that electromigration(EM) imparts significant influence on the kinetics of contact failure of Au wire bonded to an Al pad. Contact resistance between Au wire and Al pad at moderately accelerated test conditions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3967bdbc5b3499ff52358b4ef77b8d8
https://doi.org/10.1109/ectc.2009.5074126
https://doi.org/10.1109/ectc.2009.5074126
Publikováno v:
ASME 2007 Summer Bioengineering Conference.
Recent surgical management of cancer tends toward minimally invasive surgical techniques since tumors can be detected smaller than ever due to the advance of cancer diagnostic technologies. Many of these surgical procedures are thermal therapies wher
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::708c2f5b2e2138b0d070ff832ea70e4b
https://doi.org/10.1115/sbc2007-176185
https://doi.org/10.1115/sbc2007-176185