Zobrazeno 1 - 10
of 50
pro vyhledávání: '"N. Kauffmann"'
Autor:
Daniel J. Bailey, Laura J. Gardner, Martin C. Stennett, Claire L. Corkhill, Sam A. Walling, Neil C. Hyatt, Marcus N. Kauffmann
Publikováno v:
Journal of Hazardous Materials. 401:123764
Materials from GeoMelt® In-Container Vitrification (ICV)™ of simulant UK nuclear wastes were characterised to understand the partitioning of elements, including inactive surrogates for radionuclide species of interest, within the heterogeneous pro
Publikováno v:
Der Fahrer im 21. Jahrhundert
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2e605f8ecb4ce004d69a72d4a829edd
https://doi.org/10.51202/9783181023112-193
https://doi.org/10.51202/9783181023112-193
Autor:
Matthias Fippel, Joseph O. Deasy, Iwan Kawrakow, M. Vicic, I. El Naqa, K Zakarian, P.E. Lindsay, N Kauffmann, Jeffrey V. Siebers, Mladen Victor Wickerhauser
Publikováno v:
Physics in Medicine and Biology. 50:909-922
Recent studies have demonstrated that Monte Carlo (MC) denoising techniques can reduce MC radiotherapy dose computation time significantly by preferentially eliminating statistical fluctuations ('noise') through smoothing. In this study, we compare n
Akademický článek
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Autor:
Frédéric Aniel, Sylvain Blayac, J.L. Benchimol, Agnieszka Konczykowska, M. Abboun, P. Andre, Muriel Riet, N. Kauffmann, Jean Godin
Publikováno v:
IEEE Journal of Solid-State Circuits. 36:639-647
The design of high-speed circuits and optimization of function of technological and geometrical parameters are presented. Various modeling aspects are discussed, such as model accuracy for InP heterojunction bipolar transistor and modeling with techn
Publikováno v:
Proceedings of 2011 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011
IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011
IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011, 2011, Baltimore, MD, United States. pp.1-4, ⟨10.1109/RFIC.2011.5940662⟩
IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011
IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011, 2011, Baltimore, MD, United States. pp.1-4, ⟨10.1109/RFIC.2011.5940662⟩
This paper presents a novel methodology for the extraction of the substrate network components in n-MOS isolated devices, based on original “Gate-Bulk” structures. Since the main model acceptance criteria is here the frequency dependency, a large
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7836a10685462c7fc76a763c6e0157cc
https://hal.archives-ouvertes.fr/hal-00799791
https://hal.archives-ouvertes.fr/hal-00799791
Publikováno v:
2010 IEEE International Integrated Reliability Workshop Final Report.
RF reliability is becoming an increasing concern for actual technology platforms. In this context, small signal equivalent circuit degradation under hot carrier stress is investigated. It is shown that some lumped elements such as the conductance, th
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures.
For device modelling purposes, the geometry dependence of the external collector resistance has been investigated. Firstly, the collector resistance is split into a perfectly 1D vertical resistance and a 2D horizontal contribution. Using specific tes
Akademický článek
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Autor:
P. Berdaguer, A.M. Duchenois, Sylvain Blayac, J.R. Burie, J.L. Benchimol, N. Kauffmann, P. Desrousseaux, Agnieszka Konczykowska, Muriel Riet, Jean Godin, P. Andre
Publikováno v:
GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 21st Annual. Technical Digest 1999 (Cat. No.99CH36369).
To address the needs for very high speed electronic circuits for high bit-rate optical communications, we have developed an InP DHBT self-aligned process with f/sub T/ and f/sub MAX/ of 130 and 150 GHz; 40 Gb/s circuits, such as a 2:1 and 4:1 multipl