Zobrazeno 1 - 5
of 5
pro vyhledávání: '"N. J. Montgomery"'
Autor:
Francis Benistant, H.Y. Chan, C. M. Ng, N. J Montgomery, C. P. A. Mulcahy, H.-J.L. Gossmann, S. Biswas, Kai Nordlund, Lap Chan, M.P. Srinivasan, M. Harris
Publikováno v:
Thin Solid Films. 504:121-125
Prediction of the final dopant positions after ion implantation has always been strongly influenced by the choice of stopping models. A molecular dynamics (MD) method is used in this work; the nuclear stopping is treated by accurate pair potentials c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d98ed7a70937ffa802af9e0de621285d
https://doi.org/10.1016/j.tsf.2005.09.153
https://doi.org/10.1016/j.tsf.2005.09.153
Autor:
B. Moeckly, Judith L. MacManus-Driscoll, N. J. Montgomery, Richard J. Chater, David S. McPhail, K. Char
Publikováno v:
Thin Solid Films. 317:237-240
Secondary ion mass spectrometry (SIMS) has been used to carry out in-depth analysis of a superconducting multilayer thin film. The film was a multilayer composed of YBa 2 Cu 3 O 7- δ /10% cobalt-doped YBa 2 Cu 3 O 7- δ /YBa 2 Cu 3 O 7- δ (YBCO/Co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b38849c13230a5c396b32e79f17dcc5d
https://doi.org/10.1016/s0040-6090(97)00523-3
https://doi.org/10.1016/s0040-6090(97)00523-3
Publikováno v:
Journal of Alloys and Compounds. 251:355-359
A superconducting multilayer structure (YBCO/3% Co-doped YBCO/YBCO/LaAlO3) has been studied using secondary ion mass spectrometry (SIMS). Under xenon ion beam bombardment at a range of angles of incidence it has been found that the Co leading edge in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3560f1c0588ee148b070ea0de64581d1
https://doi.org/10.1016/s0925-8388(96)02810-1
https://doi.org/10.1016/s0925-8388(96)02810-1
Autor:
David S. McPhail, N. J. Montgomery
Publikováno v:
Microbeam and Nanobeam Analysis ISBN: 9783211828748
Magnesium oxide (100) single crystals were analysed by secondary ion mass spectrometry (SIMS) using a xenon ion beam incident over a wide range of angles. Optical and atomic force microscopy (AFM) were used to assess the ion beam induced surface topo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3db819b4f06144c190117c7f9caaf38b
https://doi.org/10.1007/978-3-7091-6555-3_34
https://doi.org/10.1007/978-3-7091-6555-3_34
Autor:
H.Y. Chan, M.P. Srinivasan, Kai Nordlund, C. P. A. Mulcahy, Francis Benistant, M. Harris, C. M. Ng, N. J Montgomery, S. Biswas, D Gui, Lap Chan, H.-J.L. Gossmann
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 24:462
Molecular dynamics (MD) is set to replace Monte Carlo (MC) methods utilizing the binary collision approximation (BCA) in modeling dopant distributions after ion implantation in the low energy regime. Simultaneous nonbinary interactions come into play
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::532e7aa51e53d613ca495db5f4e62b2f
https://doi.org/10.1116/1.2137333
https://doi.org/10.1116/1.2137333