Zobrazeno 1 - 9
of 9
pro vyhledávání: '"N. I. Serbu"'
Publikováno v:
Russian Microelectronics. 41:41-50
The paper presents the results of experimental investigations into probe modification for atomic-force microscopy (AFM) and scanning tunneling microscopy (STM) by etching the point of AFM cantilevers and tungsten STM probes by applying the method of
Autor:
Kainuma, Yuta, Hayashi, Kunitaka, Tachioka, Chiyaka, Ito, Mayumi, Makino, Toshiharu, Mizuochi, Norikazu, An, Toshu
Publikováno v:
Journal of Applied Physics; 12/28/2021, Vol. 130 Issue 24, p1-7, 7p
Autor:
Ageev, O.1 ageev@sfedu.ru, Il'in, O.1, Rubashkina, M.1, Smirnov, V.1, Fedotov, A.1, Tsukanova, O.1
Publikováno v:
Technical Physics. Jul2015, Vol. 60 Issue 7, p1044-1050. 7p. 1 Black and White Photograph, 1 Diagram, 5 Graphs.
Autor:
Alyabyeva, N., Sakai, J., Bavencoffe, M., Wolfman, J., Limelette, P., Funakubo, H., Ruyter, A.
Publikováno v:
Applied Physics Letters; 12/10/2018, Vol. 113 Issue 24, pN.PAG-N.PAG, 4p, 3 Graphs
Publikováno v:
Intelligent Nanomaterials (9781119242482); 2016, p361-394, 34p
Publikováno v:
Nanotechnologies in Russia; Mar2014, Vol. 9 Issue 3/4, p145-150, 6p
Autor:
Ageev, O., Alekseev, A., Vnukova, A., Gromov, A., Kolomiytsev, A., Konoplev, B., Lisitsyn, S.
Publikováno v:
Nanotechnologies in Russia; Jan2014, Vol. 9 Issue 1/2, p26-30, 5p
Publikováno v:
Nanotechnologies in Russia; Jan2014, Vol. 9 Issue 1/2, p31-37, 7p
Publikováno v:
Russian Microelectronics; Jan2012, Vol. 41 Issue 1, p41-50, 10p