Zobrazeno 1 - 10
of 46
pro vyhledávání: '"N. Harjee"'
Publikováno v:
Micro & Nano Letters. 4:204-209
A selective epitaxial fabrication method to form piezoresistors on the sidewalls of microfabricated cantilevers for in-plane force sensing applications and their preliminary characterisation results is reported. The piezoresistors were made of a dope
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ce93df161d9bd1298f584c31b32ae07
https://doi.org/10.1049/mnl.2009.0075
https://doi.org/10.1049/mnl.2009.0075
Autor:
Markus Koenig, A. G. F. Garcia, Beth L. Pruitt, N. Harjee, A. J. Haemmerli, David Goldhaber-Gordon
Publikováno v:
Journal of Applied Physics, vol 118, iss 3
The lateral resolution of many electrical scanning probe techniques is limited by the spatial extent of the electrostatic potential profiles produced by their probes. Conventional unshielded conductive atomic force microscopy probes produce broad pot
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0665a5861755c344128f470a92475ebe
https://escholarship.org/uc/item/7v79s58d
https://escholarship.org/uc/item/7v79s58d
Publikováno v:
2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII).
Microsystems and cantilever-based assays enable a wealth of custom measurements and analysis systems matched to the scale of cell biomechanics and mechanotransduction assays. Novel force and displacement sensors and actuators have been applied to stu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::952ea2b93b922f78fa8fe5b44f7bac40
https://doi.org/10.1109/transducers.2013.6627369
https://doi.org/10.1109/transducers.2013.6627369
Autor:
Matthias Baenninger, Hartmut Buhmann, David Goldhaber-Gordon, Philipp Leubner, N. Harjee, Beth L. Pruitt, Christoph Brüne, Laurens W. Molenkamp, A. G. F. Garcia, Markus König, Christopher P. Ames
Publikováno v:
Physical Review X, Vol 3, Iss 2, p 021003 (2013)
The discovery of the Quantum Spin Hall state, and topological insulators in general, has sparked strong experimental efforts. Transport studies of the Quantum Spin Hall state confirmed the presence of edge states, showed ballistic edge transport in m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::24f0206eb2d0ecf47b14256ab2655f21
https://doi.org/10.1103/physrevx.3.021003
https://doi.org/10.1103/physrevx.3.021003
Autor:
Yue Ma, Xinxin Li, Zhi-Xun Shen, Worasom Kundhikanjana, Beth L. Pruitt, A. J. Haemmerli, Yongliang Yang, N. Harjee, Michael Kelly, Keji Lai
Publikováno v:
2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS).
In this paper, we present the design and fabrication of piezoresistive Microwave Impedance Microscopy (MIM) cantilever probes integrated with low impedance, electrically-shielded sharp tips to enable simultaneous topographical and electrical scanning
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d42f7a19d5509c279bdfc42a2b5c9a1
https://doi.org/10.1109/memsys.2013.6474243
https://doi.org/10.1109/memsys.2013.6474243
Autor:
A. J. Haemmerli, Keji Lai, David Goldhaber-Gordon, Worasom Kundhikanjana, Zhi-Xun Shen, N. Harjee, R. T. Nielsen, Yushi Yang, Beth L. Pruitt
Publikováno v:
2012 IEEE 25th International Conference on Micro Electro Mechanical Systems (MEMS).
We present new scanning probes suitable for Microwave Impedance Microscopy measurements on any scanning platform using a piezoactuator. We microfabricated piezoresistive cantilevers integrated with low-impedance, electrically-shielded transmission li
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::145a3495147bce442e0bcddae9e67f94
https://doi.org/10.1109/memsys.2012.6170145
https://doi.org/10.1109/memsys.2012.6170145
Autor:
N. Harjee, Harry Jonathon Mamin, Beth L. Pruitt, B. W. Chui, Ginel C. Hill, Jose I. Padovani, Joseph C. Doll, Daniel Rugar
Publikováno v:
2011 IEEE 24th International Conference on Micro Electro Mechanical Systems.
Cracks patterned lithographically into the buried oxide (BOX) layer of silicon-on-insulator wafers were found to substantially improve yield in the release of ultrasoft silicon cantilevers. The BOX layer is useful as an etch stop and sacrificial laye
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8763355a82730ef27a67bc0a69542b9
https://doi.org/10.1109/memsys.2011.5734421
https://doi.org/10.1109/memsys.2011.5734421
Publikováno v:
2010 IEEE Sensors.
We present the design and fabrication of an improved probe for scanning gate microscopy (SGM). Like our previously reported design, the new probe integrates a coaxial tip to produce highly localized electric fields and a piezoresistor to self-sense t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::933cd3b8654303993dd3d32794961aa8
https://doi.org/10.1109/icsens.2010.5689882
https://doi.org/10.1109/icsens.2010.5689882
Publikováno v:
2010 IEEE Sensors.
Piezoresistive cantilevers are commonly used for force sensing. However, the design of piezoresistive cantilevers is complicated by coupling between many design parameters as well as design and operation constraints. Here, we discuss analytical model
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0ec0f265213439483b2973988b0e26f
https://doi.org/10.1109/icsens.2010.5689978
https://doi.org/10.1109/icsens.2010.5689978
Autor:
David Goldhaber-Gordon, Joseph C. Doll, Markus König, N. Harjee, A. G. F. Garcia, Beth L. Pruitt
Publikováno v:
2010 IEEE 23rd International Conference on Micro Electro Mechanical Systems (MEMS).
We have designed and batch fabricated silicon cantilever scanning probes integrating, for the first time, a coaxial tip to produce highly localized electric fields and a piezoresistor to measure cantilever deflection. These probes will improve the la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ebc10aa64f324395a7c70ed04da1fecf
https://doi.org/10.1109/memsys.2010.5442494
https://doi.org/10.1109/memsys.2010.5442494