Zobrazeno 1 - 10
of 101
pro vyhledávání: '"N. Dytlewski"'
Autor:
Ken Short, T.D.M. Weijers, M.P Fewell, B. Gong, Robert Elliman, P.T. Burke, Heiko Timmers, J.M Priest, P. Garlick, N. Dytlewski, K.E. Prince
Publikováno v:
Stainless Steel 2000
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32ec97b2b10d4638ec7d2f8d438b4290
https://doi.org/10.1201/9780367814151-20
https://doi.org/10.1201/9780367814151-20
Publikováno v:
Current Applied Physics. 4:292-295
Ion beam analysis techniques have been used to probe for carbon contamination in high temperature superconductor thin films. These techniques provide a powerful tool to detect C with limit of detection close to 0.01 at.% and to measure carbon depth p
Publikováno v:
Scopus-Elsevier
Large grained polycrystalline silicon thin films have been prepared by low-temperature solid phase crystallisation of sputter-deposited hydrogenated amorphous silicon (a-Si:H), with relatively short processing times, and a considerably low thermal bu
Publikováno v:
Scopus-Elsevier
We have undertaken a study on the influence of deposition temperature and an in‐chamber annealing treatment on the hydrogen depth profiles of sputter‐deposited hydrogenated amorphous silicon (a‐Si:H) thin films. Our results show that for higher
Publikováno v:
Thin Solid Films. 271:151-156
Hydrogenated amorphous silicon (a-Si:H) thin films deposited by the reactive-sputtering technique and, in some cases, indashsitu annealed were subjected to further thermal annealing steps to 600 °C. Elastic recoil detection analysis measurements ind
Publikováno v:
Journal of Applied Physics. 77:2985-2988
The deep level transient spectroscopy technique has been used to study the EL2 defect in n‐type semiconducting GaAs subjected to 1 MeV fast neutrons at room temperature. After neutron irradiation, the EL3 defect which is usually detected between 18
Publikováno v:
Physica Status Solidi (a). 145:K37-K42
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 327:469-479
Methods are presented for reliably estimating the uncertainties in quantities of plutonium as measured using neutron coincidence counting for nuclear safeguards purposes. For the conventional two-parameter assay technique, semi-empirical equations ar
Autor:
Kai Arstila, E. Kótai, Eero Rauhala, N. Dytlewski, Giorgio Lulli, Marco Bianconi, M. Mayer, N.P. Barradas, Michael Thompson, Gábor Battistig, Chris Jeynes, Edit Szilágyi
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v.266, 1338-1342 (2008)
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
266 (2008): 1338–1342. doi:10.1016/j.nimb.2007.10.043
info:cnr-pdr/source/autori:Barrada NP; Arstila K; Battistig G; Bianconi M; Dytlewski N; Jeynes C; Kotai E; Lulli G; Mayer M; Rauhala E; Szilagyi E; Thompson M/titolo:Summary of IAEA intercomparison of IBA software/doi:10.1016%2Fj.nimb.2007.10.043/rivista:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (Print)/anno:2008/pagina_da:1338/pagina_a:1342/intervallo_pagine:1338–1342/volume:266
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
266 (2008): 1338–1342. doi:10.1016/j.nimb.2007.10.043
info:cnr-pdr/source/autori:Barrada NP; Arstila K; Battistig G; Bianconi M; Dytlewski N; Jeynes C; Kotai E; Lulli G; Mayer M; Rauhala E; Szilagyi E; Thompson M/titolo:Summary of IAEA intercomparison of IBA software/doi:10.1016%2Fj.nimb.2007.10.043/rivista:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (Print)/anno:2008/pagina_da:1338/pagina_a:1342/intervallo_pagine:1338–1342/volume:266
The International Atomic Energy Agency has sponsored a formal intercomparison exercise for the seven depth profiling ion beam analysis codes, which are: GISA, RUMP, RBX, DEPTH, DataFurnace, SIMNRA and MCERD. This intercomparison is published in Nucl.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae6e0a75da24568f5e8be1853f460ce4
https://surrey.eprints-hosting.org/722449/
https://surrey.eprints-hosting.org/722449/
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 290:197-207
This paper describes a procedure for estimating assay variance for the neutron multiplicity counters that are being developed to assay special nuclear materials. The procedure estimates the moments of the expected neutron multiplicity distribution an