Zobrazeno 1 - 2
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pro vyhledávání: '"N. D. Bassim"'
Autor:
K.-S. Chang, N. D. Bassim, P. K. Schenck, J. Suehle, I. Takeuchi, M. L. Green, David G. Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M. Secula
Publikováno v:
AIP Conference Proceedings.
As the CMOS gate stack continues to scale to smaller dimensions, new materials must be introduced into the stack to keep pace with design requirements. One way to measure the properties of new materials systems is through the use of high‐throughput
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18f110ae6123a2bac003799dadaffef3
https://doi.org/10.1063/1.2799387
https://doi.org/10.1063/1.2799387
Publikováno v:
Nanotechnology; 4/18/2017, Vol. 28 Issue 15, p1-1, 1p