Zobrazeno 1 - 10
of 50
pro vyhledávání: '"N. Braslau"'
Autor:
Jerry M Woodall, A. C. Warren, George David Pettit, M. R. Melloch, D. T. McInturff, N. Braslau, Peter D. Kirchner
Publikováno v:
Applied Physics Letters. 60:448-450
We report on photoemission measurements of molecular‐beam‐epitaxy‐grown GaAs p‐i‐n structures, in which the optically active insulating GaAs layer contains As precipitates (GaAs:As). GaAs:As is formed by low‐temperature growth of GaAs at
Publikováno v:
Applied Physics Letters. 63:189-190
We report noncontact measurements of the effective minority carrier lifetime in the superficial silicon layer of silicon‐on‐insulator wafers. The carriers are excited by a pulse of short‐wavelength photons (λ≤350 nm), all of which are absorb
Autor:
N. Braslau, D. T. McInturff, Peter D. Kirchner, A. C. Warren, Jerry M Woodall, George David Pettit, Michael R. Melloch
Publikováno v:
Applied Physics Letters. 62:2367-2368
We report on photoemission measurements of MBE‐grown Al0.27Ga0.73As p‐i‐n structures in which the optically active insulating layers contain arsenic precipitates (Al0.27Ga0.73As:As). Al0.27Ga0.73As:As layers were formed by low temperature growt
Publikováno v:
Journal of Applied Physics. 61:1516-1522
The dependence of the Schottky barrier height of Mo‐n:AlGaAs junctions, fabricated in situ by molecular beam epitaxy, on the Al mole fraction (x) was determined by internal photoemission measurements and by activation energy plots of the current ve
Autor:
N. Braslau
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 4:3085-3090
Despite the rapid maturing of GaAs as an integrated circuit technology, both for digital and analog applications, the rather empirical nature of our contact metallurgy betrays a lack of basic scientific understanding of the metal–semiconductor inte
Publikováno v:
Solid-State Electronics. 31:337-340
We have measured the electron velocity in low-doped GaAs and in AlGaAs/GaAs modulation-doped heterostructures at electric fields up to 8000 V/cm at both 300 and 77 K. In order to avoid the charge domain formation which occurs in DC measurements at th
Publikováno v:
Journal of Applied Physics. 62:4812-4820
Barrier heights of refractory W, WSix, and WAlx Schottky contacts deposited on n‐GaAs with different surface treatments have been electrically characterized by current‐voltage, capacitance‐voltage, and internal photoemission measurements. Inter
Autor:
N. Braslau, P. P. Sorokin
Publikováno v:
IBM Journal of Research and Development. 8:177-181
A double quantum stimulated emission device is proposed and some operating characteristics and relevant systems of materials are discussed.
Publikováno v:
Physical Review. 123:1801-1811
Autor:
N. Braslau, Gilbert O. Brink
Publikováno v:
Review of Scientific Instruments. 30:670-674
A system is described which allows the magnetic field of the ``C'' magnet of an atomic‐beam magnetic‐resonance apparatus to be locked to a resonance in the beam. The construction of the system is discussed and representative performance data are