Zobrazeno 1 - 1
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pro vyhledávání: '"N. B. ROMLI"'
Publikováno v:
Journal of Engineering Science and Technology, Vol 10, Iss 3, Pp 364-382 (2015)
Total power dissipation in CMOS circuits has become a huge challenging in current semiconductor industry due to the leakage current and the leakage power. The exponential growth of both static and dynamic power dissipations in any CMOS process techno
Externí odkaz:
https://doaj.org/article/1248829086604e968f8e6af5dd0fb5db
