Zobrazeno 1 - 10
of 745
pro vyhledávání: '"N. A. Dodds"'
Autor:
Y. Xiong, A. Feeley, N. J. Pieper, D. R. Ball, B. Narasimham, J. Brockman, N. A. Dodds, S. A. Wender, S. -J. Wen, R. Fung, B. L. Bhuva
Publikováno v:
2022 IEEE International Reliability Physics Symposium (IRPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd630db995b14852c62b70724e077dc9
https://doi.org/10.1109/irps48227.2022.9764523
https://doi.org/10.1109/irps48227.2022.9764523
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b9578b29d11413d082e415625396b2c
https://doi.org/10.1109/tns.2023.3240979
https://doi.org/10.1109/tns.2023.3240979
Autor:
N. J. Gaspard, Dale McMorrow, M. P. King, Ronald D. Schrimpf, Nicholas C. Hooten, J. A. Pellish, J. H. Warner, Scott L. Jordan, William G. Bennett, Nicolas J.-H. Roche, S. P. Buchner, N. A. Dodds, Robert A. Reed
Publikováno v:
IEEE Transactions on Nuclear Science. 60:2550-2558
Laser and heavy-ion data reveal the areas and shapes of single-event latchup (SEL)-sensitive regions in CMOS test structures and their positions relative to the affected p-n-p-n paths. Contrary to previous two-dimensional studies, this three-dimensio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36ff84029bb6c4b372d5c418fc68d388
https://doi.org/10.1109/tns.2013.2246189
https://doi.org/10.1109/tns.2013.2246189
Autor:
En Xia Zhang, Scott L. Jordan, N. J. Gaspard, Cheryl J. Marshall, Rick Wong, N. A. Dodds, S.-J. Wen, Dale McMorrow, Jonathan A. Pellish, Robert A. Reed, James Fred Salzman, Jeffrey H. Warner, Bharat L. Bhuva, Nicolas J.-H. Roche, William G. Bennett, Ronald D. Schrimpf, Nicholas C. Hooten
Publikováno v:
IEEE Transactions on Nuclear Science. 59:2642-2650
Heavy ion, neutron, and laser experimental data are used to evaluate the effectiveness of various single event latchup (SEL) hardening strategies, including silicon-on-insulator (SOI), triple well, and guard rings. Although SOI technology is widely r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85c0fde2f744835a43412675efb744f3
https://doi.org/10.1109/tns.2012.2224374
https://doi.org/10.1109/tns.2012.2224374
Autor:
N. A. Dodds, Robert A. Reed, Larry D. Edmonds, J. R. Ahlbin, William G. Bennett, Ronald D. Schrimpf, Nicholas C. Hooten, Robert A. Weller
Publikováno v:
IEEE Transactions on Nuclear Science. 59:2710-2721
Pulsed-laser induced charge-collection measurements in a bulk silicon diode are used to investigate charge collection mechanisms during high-level carrier generation conditions. The recently developed Ambipolar Diffusion with a Cutoff (ADC) model for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a6ccdbd60aeb70ff3e5fe9d849a83bd
https://doi.org/10.1109/tns.2012.2224133
https://doi.org/10.1109/tns.2012.2224133
Autor:
Stephen A. Wender, Marcus H. Mendenhall, J.R. Schwank, Paul E. Dodd, M.A. Clemens, Brian D. Sierawski, Kevin M. Warren, Marty R. Shaneyfelt, Robert A. Weller, N. A. Dodds, Robert Baumann, Robert A. Reed
Publikováno v:
IEEE Transactions on Nuclear Science. 58:2591-2598
Neutron-induced charge collection data and computer simulations presented here show that the presence of high-Z materials, like tungsten, can increase the single event upset (SEU) and multiple cell upset (MCU)cross sections of high critical charge (Q
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c060a728c2f68252d3f2a32c42fec670
https://doi.org/10.1109/tns.2011.2171716
https://doi.org/10.1109/tns.2011.2171716
Autor:
G. Vizkelethy, Matthew J. Gadlage, Robert A. Reed, Lloyd W. Massengill, N. A. Dodds, J. R. Ahlbin, Ronald D. Schrimpf, Nicholas C. Hooten, Bharat L. Bhuva
Publikováno v:
IEEE Transactions on Nuclear Science. 58:1093-1097
Pulse widths of single-event transients produced by alpha particles in a 65-nm bulk CMOS technology are reported. The experimental setup and calibration of the alpha particle experiment is described in detail. A focused-ion beam is also utilized to e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eade8229fa3237f45f951e1105ac921d
https://doi.org/10.1109/tns.2011.2112378
https://doi.org/10.1109/tns.2011.2112378
Autor:
Elizabeth Auden, Robert A. Weller, Ronald D. Schrimpf, M. P. King, L A Arpin, Robert A. Reed, Makoto Asai, Marcus H. Mendenhall, N. A. Dodds
Publikováno v:
IEEE Transactions on Nuclear Science. 58:899-905
Monte Carlo simulations demonstrate that electrons in a Europa-like radiation environment produce single events capable of depositing more than 100 keV in a shielded focal plane array (FPA). Aluminum shielding slows down high energy free space electr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21beb033e67a91a2d4314ad7f7bb905b
https://doi.org/10.1109/tns.2011.2129531
https://doi.org/10.1109/tns.2011.2129531
Autor:
Robert A. Reed, Marty R. Shaneyfelt, V. Ferlet-Cavrois, N. A. Dodds, Gyorgy Vizkelethy, Marcus H. Mendenhall, Paul E. Dodd, James H. Adams, Robert A. Weller, M. P. King, M.A. Clemens, Ronald D. Schrimpf, J.R. Schwank
Publikováno v:
IEEE Transactions on Nuclear Science. 56:3172-3179
Direct charge collection measurements are presented, which prove that the presence of tungsten near sensitive volumes leads to extreme charge collection events through nuclear reactions. We demonstrate that, for a fixed incident particle linear energ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d121f9b51578afbe321d31af0ff62dd
https://doi.org/10.1109/tns.2009.2034160
https://doi.org/10.1109/tns.2009.2034160
Autor:
Tatsumi Koi, Makoto Asai, D. Wright, Ronald D. Schrimpf, M.A. Clemens, Marcus H. Mendenhall, Robert A. Reed, Robert A. Weller, N. A. Dodds
Publikováno v:
IEEE Transactions on Nuclear Science. 56:3158-3164
There is a need for improved physics models to correctly predict single event effects (SEEs) caused by nuclear reaction products from heavy ion radiation. Previous validations for nuclear fragmentation simulations are shown to be insufficient to supp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb5d0cce4d5252324902de4b6a8bc7db
https://doi.org/10.1109/tns.2009.2033693
https://doi.org/10.1109/tns.2009.2033693