Zobrazeno 1 - 10
of 311
pro vyhledávání: '"N Venkataramani"'
Autor:
Nidhin George Mathews, Aloshious Lambai, Gaurav Mohanty, N. Venkataramani, Gerhard Dehm, Balila Nagamani Jaya
Publikováno v:
Materials & Design, Vol 235, Iss , Pp 112440- (2023)
Damage tolerance of a thin film attached to a substrate is dependent on several parameters such as film thickness, film orientation, residual stresses, nature of interfaces, microstructure and defects present. Here we study the fracture resistance an
Externí odkaz:
https://doaj.org/article/f275cb3f0fc243be8f3b766e25ff4d95
Publikováno v:
Ceramics International. 48:26546-26552
Publikováno v:
Ceramics International. 48:7876-7884
Publikováno v:
Materials Today: Proceedings. 67:404-409
Publikováno v:
AIP Advances, Vol 8, Iss 5, Pp 056118-056118-6 (2018)
Single phase nano-crystalline zinc ferrite (ZnFe2O4) thin films were deposited on fused quartz substrate using the pulsed laser deposition technique. The films were deposited at different substrate temperatures. The field dependence of magnetization
Externí odkaz:
https://doaj.org/article/69fb819c45734a4f82e21a073a1d705d
Publikováno v:
AIP Advances, Vol 8, Iss 5, Pp 056112-056112-6 (2018)
MnFe2O4 thin films were pulsed laser deposited on to quartz substrate from room temperature (RT) to 650 °C in a pure argon environment. Temperature dependence of spontaneous magnetization (4πMS) was measured on these films from 10 K to 350 K using
Externí odkaz:
https://doaj.org/article/840d6acea1f3423d96eca4366050ca1a
Publikováno v:
AIP Advances, Vol 7, Iss 5, Pp 056102-056102-6 (2017)
Zinc ferrite thin films of varying thickness were deposited at ambient temperature using RF-magnetron sputtering. The films were annealed at temperatures in the range 250 °C to 650 °C in air for 2 hrs. The magnetization of the film was observed to
Externí odkaz:
https://doaj.org/article/541fa78cd47d4c1287c25ced94c2e76d
Publikováno v:
Journal of Applied Physics
Barium titanate is a brittle, lead free ferroelectric and piezoelectric ceramic used in patterned and thin film forms in micro- and nano-scale electronic devices. Both during deposition and eventually during service, this material system develops str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5abcb1507b6d84912ecb04e034eba2d7
https://hdl.handle.net/21.11116/0000-000A-CA24-A21.11116/0000-000A-CA26-8
https://hdl.handle.net/21.11116/0000-000A-CA24-A21.11116/0000-000A-CA26-8
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Akademický článek
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