Zobrazeno 1 - 10
of 16
pro vyhledávání: '"N M Ridler"'
Publikováno v:
Electronics Letters, Vol 58, Iss 16, Pp 614-616 (2022)
Abstract Techniques to precisely characterise RF components at milli‐Kelvin temperatures support the development of quantum computing systems utilising these components. In this work, an S‐parameter measurement setup to characterise RF integrated
Externí odkaz:
https://doaj.org/article/f519c0ef53ae4659a162dd5d589a677e
Publikováno v:
2021 51st European Microwave Conference (EuMC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::37687b8cc8fb5fc09af08b7f9e5a3880
https://doi.org/10.23919/eumc50147.2022.9784174
https://doi.org/10.23919/eumc50147.2022.9784174
All measurements have an associated uncertainty and it is important to know the uncertainty in order to quantify the reliability of the measurement result. At the National Physical Laboratory (NPL), the provision of scattering parameter (S-parameter)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f3dedd186a37faa035bfd73be51498b
https://doi.org/10.47120/npl.tqe16
https://doi.org/10.47120/npl.tqe16
Autor:
N. M. Ridler, R. A. Ginleyt
Publikováno v:
2017 89th ARFTG Microwave Measurement Conference (ARFTG).
A new series of standards has recently been published by IEEE defining waveguide for use at millimeter-wave and terahertz frequencies. The series comprises three standards covering different aspects of this technology: (i) frequency bands and wavegui
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79c7f3e8d364f6aaca804a2b0ff264b8
https://doi.org/10.1109/arftg.2017.8000830
https://doi.org/10.1109/arftg.2017.8000830
Autor:
N M Ridler, M Horibe
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 60:2327-2334
This paper summaries a bilateral comparison of dimensional measurements of the diameters of two precision 1.85-mm coaxial air lines and associated electrical scattering parameter measurements. The measurements were independently made by two national
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b7226a8c4069b16c8aa0a62d40aa0568
https://doi.org/10.1109/tim.2011.2135510
https://doi.org/10.1109/tim.2011.2135510
Publikováno v:
3rd Annual Seminar on Passive RF and Microwave Components.
As components increase their rate of data processing the Printed Circuit Board is expected to transfer data at ever faster rates to keep pace. Beyond 2 Gb/s the impact of dielectric loss becomes a critical factor in the design process. Agreement of l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8166f2a277c3ab86763610863b88ca94
https://doi.org/10.1049/ic.2012.0067
https://doi.org/10.1049/ic.2012.0067
Publikováno v:
2008 72nd ARFTG Microwave Measurement Symposium.
This paper presents a comparison of two methods for measuring the electrical loss for transmission lines on printed circuit boards (PCBs). The two methods are (i) the root impulse energy (RIE) method which is a time-domain reflectometry (TDR)-based m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::987472a67c6e8d22fb6ea14fd3780c73
https://doi.org/10.1109/arftg.2008.4804275
https://doi.org/10.1109/arftg.2008.4804275