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Publikováno v:
IOP Conference Series: Earth and Environmental Science. 1052:012126
The article describes a method developed for determining the degree of damage to wheat grain caused by smut fungi, which makes it possible to determine its non-toxic level, to increase the measurement accuracy and reliability of the results obtained,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3960be98e1158b9300dfd973b2c5b51e
https://doi.org/10.1088/1755-1315/1052/1/012126
https://doi.org/10.1088/1755-1315/1052/1/012126
