Zobrazeno 1 - 10
of 24
pro vyhledávání: '"N A Shandyba"'
Autor:
S. V. Balakirev, Oleg A. Ageev, Natalia E. Chernenko, M. S. Solodovnik, M. M. Eremenko, N. A. Shandyba, Danil V. Kirichenko
Publikováno v:
Applied Surface Science. 578:152023
In order to consider quantum dots as single objects and to use them in modern electronic and photonic devices, they must be well-isolated from each other and have an appropriate size and structural quality. This is a big challenge that is difficult t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd83bb5411c4966712e3f3e591a0e0f8
https://doi.org/10.1016/j.apsusc.2021.152023
https://doi.org/10.1016/j.apsusc.2021.152023
Publikováno v:
Journal of Physics: Conference Series. 2086:012007
In this work, we studied the effect of the deposition thickness, growth rate, arsenic flux, and implantation dose on the morphology of the GaAs nanostructures grown on modified Si areas. It is shown that an increase in the growth rate at the initial
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09fc948e6a3456a81afe07fbea71bff8
https://doi.org/10.1088/1742-6596/2086/1/012007
https://doi.org/10.1088/1742-6596/2086/1/012007
Publikováno v:
Journal of Physics: Conference Series. 2086:012201
The paper presents the results of experimental studies of the influence of the main parameters of a focused ion beam (FIB) during surface profiling on the accuracy of transfer of a pattern to a silicon substrate to create nanoscale field emission str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa05c7e59f7ce62abbb87d754b622e94
https://doi.org/10.1088/1742-6596/2086/1/012201
https://doi.org/10.1088/1742-6596/2086/1/012201
Autor:
N A Shandyba, N E Chernenko, J Y Zhityaeva, O I Osotova, M M Eremenko, S V Balakirev, M S Solodovnik
Publikováno v:
Journal of Physics: Conference Series. 2086:012036
We present the results of studies of the effect of wet chemical treatment on the properties of a GaAs surface modified by a gallium focused ion beam. Our studies based on results of AFM, KpAFM and Raman spectroscopy measurements have shown that, duri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::59584be044e7f7b39da4f5a3b6d7dfdf
https://doi.org/10.1088/1742-6596/2086/1/012036
https://doi.org/10.1088/1742-6596/2086/1/012036
Publikováno v:
Journal of Physics: Conference Series. 2086:012204
In this work, we carried out an investigation of commercial atomic force microscope (AFM) probes for contact and semi-contact modes, which were modified by focused ion beam (FIB). This method was used to modify the original tip shape of silicon AFM p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be84156cc0ab3c4303289b300701d8c1
https://doi.org/10.1088/1742-6596/2086/1/012204
https://doi.org/10.1088/1742-6596/2086/1/012204
Autor:
M M Eremenko, N A Shandyba, N E Chernenko, S V Balakirev, L S Nikitina, M S Solodovnik, O A Ageev
Publikováno v:
Journal of Physics: Conference Series. 2086:012027
In this work, we studied the effect of annealing the silicon surface on the morphology of focused ion beam modified areas. It was found that an increase in the ion beam accelerating voltage during surface treatment significantly affects the morpholog
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55039b280e3de958fda18471f7dde41f
https://doi.org/10.1088/1742-6596/2086/1/012027
https://doi.org/10.1088/1742-6596/2086/1/012027
Publikováno v:
AIP Conference Proceedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bd59f2e37f6e82aeb791bb8d0ef26a9
https://doi.org/10.1063/1.5087673
https://doi.org/10.1063/1.5087673
Publikováno v:
Journal of Physics: Conference Series. 1697:012056
This article presents the results of a theoretical study of a field emission cell with a vertically oriented emitter. The field emission cell was formed based on a combination of etched methods with a Ga+ focused ion beam and local ion-stimulated tun
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6183ceda52ab98a90cc48ecd1cc1cbe3
https://doi.org/10.1088/1742-6596/1697/1/012056
https://doi.org/10.1088/1742-6596/1697/1/012056
Publikováno v:
Journal of Physics: Conference Series. 1695:012182
This paper presents the results of theoretical and experimental studies aimed at studying the influence of the basic geometric parameters of micromechanical cantilevers on the resonant frequency of their oscillations. The dependences of the oscillati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea5b5d5fab2aa59f47ada654c926ea6d
https://doi.org/10.1088/1742-6596/1695/1/012182
https://doi.org/10.1088/1742-6596/1695/1/012182
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 699:012042
The results of an experimental study of the fabrication of high aspect probe tips for atomic force microscopy (AFM) and critical dimension AFM (CD AFM) using the focused ion beam (FIB) milling and ion beam induced deposition of carbon are presented.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6273e9a1b45611606538999295f499be
https://doi.org/10.1088/1757-899x/699/1/012042
https://doi.org/10.1088/1757-899x/699/1/012042