Zobrazeno 1 - 10
of 228
pro vyhledávání: '"Myung-suk Kim"'
Publikováno v:
Journal of Pharmacological Sciences, Vol 94, Iss 3, Pp 221-232 (2004)
Hypoxia-inducible factor 1 (HIF-1) is a transcription factor that functions as a master regulator of oxygen homeostasis. HIF-1 regulates the expressions of the proteins that increase oxygen delivery, which enables cells to survive in oxygen-deficient
Externí odkaz:
https://doaj.org/article/4857521a68bc4c1ab82d1fb0b5219ec3
Supplementary Fig. S1 from A novel mode of action of YC-1 in HIF inhibition: stimulation of FIH-dependent p300 dissociation from HIF-1α
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e7265e59c9a8091efd42bffd9c68e68c
https://doi.org/10.1158/1535-7163.22484207.v1
https://doi.org/10.1158/1535-7163.22484207.v1
Hypoxia-inducible factor (HIF)-1 plays a key role in tumor promotion by inducing ∼60 genes required for tumor adaptation to hypoxia; thus, it is viewed as a target for cancer therapy. For this reason, YC-1, which down-regulates HIF-1α and HIF-2α
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3c4f3e9c648e3b3cffd7ac0a9312d61a
https://doi.org/10.1158/1535-7163.c.6531353
https://doi.org/10.1158/1535-7163.c.6531353
Autor:
Jong-Wan Park, Myung-Suk Kim, Jinho Kim, HoSung Cho, In-Jin Jang, Young-Suk Cho, Yang-Sook Chun, Ji-Hye Ryu, Eun-Jin Yeo
Hypoxia-inducible factor-1α (HIF-1α) seems central to tumor growth and progression because it up-regulates genes essential for angiogenesis and the hypoxic adaptation of cancer cells, which is why HIF-1α inhibition is viewed as a cancer therapy st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a505c0b57eaeb7fbfa14550bc14ae429
https://doi.org/10.1158/0008-5472.c.6494243
https://doi.org/10.1158/0008-5472.c.6494243
Autor:
Jong-Wan Park, Myung-Suk Kim, Jinho Kim, HoSung Cho, In-Jin Jang, Young-Suk Cho, Yang-Sook Chun, Ji-Hye Ryu, Eun-Jin Yeo
Supplementary Figures 1 and 2 from YC-1 Induces S Cell Cycle Arrest and Apoptosis by Activating Checkpoint Kinases
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cb50cc5aa6331cf3307130f4d5cea499
https://doi.org/10.1158/0008-5472.22364546
https://doi.org/10.1158/0008-5472.22364546
Autor:
Jong-Wan Park, Myung-Suk Kim, Jinho Kim, HoSung Cho, In-Jin Jang, Young-Suk Cho, Yang-Sook Chun, Ji-Hye Ryu, Eun-Jin Yeo
Supplementary Figure Legends from YC-1 Induces S Cell Cycle Arrest and Apoptosis by Activating Checkpoint Kinases
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0bf62a0e6efd6b449a878fffd5ed2cf6
https://doi.org/10.1158/0008-5472.22364549
https://doi.org/10.1158/0008-5472.22364549
Autor:
Myung-Suk Kim
Publikováno v:
Korean Journal of Social Theory. 61:103-146
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::41618c641e1d9e0e811afd4903aa4130
https://doi.org/10.37245/kjst.2022.05.61.103
https://doi.org/10.37245/kjst.2022.05.61.103
Autor:
Jai Hyuk Song, Saetbyeol Yoon, Jeongin Choe, Woo Young Choi, Ki-whan Song, Myung-Suk Kim, Kim Taehyeon, Sangyong Yoon
Publikováno v:
International Symposium for Testing and Failure Analysis.
We have adopted various defect detection systems in the front stage of manufacturing in order to effectively manage the quality of flash memory products. In this paper, we propose an intelligent pattern recognition methodology which enables us to dis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c8eb7b817efcf69a1d6f0dec593807b
https://doi.org/10.31399/asm.cp.istfa2021p0406
https://doi.org/10.31399/asm.cp.istfa2021p0406
Autor:
Bu-il Nam, Eun-Kyoung Kim, Woo Young Choi, Myung-Suk Kim, Jae In Lee, Ki-whan Song, Boh-Chang Kim, Ki-Young Dong, Youngha Choi, Dooyeun Jung, Jai Hyuk Song
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents a novel approach for detecting channel hole bending (ChB) defects in vertical NAND flash memory. Such defects are the result of etching process inconsistencies and contribute to data loss and device failure by inducing leakage cur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9ff14c83ed8822b7ba75dda66da8f38
https://doi.org/10.31399/asm.cp.istfa2021p0306
https://doi.org/10.31399/asm.cp.istfa2021p0306
Autor:
Lee Dae-Hyeon, Jai Hyuk Song, Ji-Suk Kim, Youngwook Jeong, Earl Kim, Wanha Hwang, Jae-Young Kim, Woo Young Choi, Ki-whan Song, Miju Yang, Eun-Kyoung Kim, Daesik Ham, Sangyong Yoon, Myung-Suk Kim, Taeheon Lee
Publikováno v:
International Symposium for Testing and Failure Analysis.
In the NAND flash manufacturing process, thousands of internal electronic fuses (eFuse) are tuned in order to optimize performance and validity. In this paper, we propose a machine learning optimization technique that uses deep learning (DL) and gene
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f110c74a7800d6f8be2c838f793c298e
https://doi.org/10.31399/asm.cp.istfa2021p0020
https://doi.org/10.31399/asm.cp.istfa2021p0020