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pro vyhledávání: '"Myounghun Lee"'
Autor:
Ki-Tae Yoo, Mina Lim, Soyeon Cho, Jai-Won Byeon, Dong-O Kim, Myounghun Lee, Jae-Yeon Kim, Zeli Wang
Publikováno v:
Journal of Applied Reliability. 19:39-47
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a20e5292858d5ace0251f5298d46706
https://doi.org/10.33162/jar.2019.03.19.1.39
https://doi.org/10.33162/jar.2019.03.19.1.39
