Zobrazeno 1 - 10
of 81
pro vyhledávání: '"Myers AF"'
Autor:
Karim ET; American Dental Association Science and Research Institute, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Szalai V; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Cumberland L; Radiation Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Myers AF; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Takagi S; American Dental Association Science and Research Institute, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Frukhtbeyn SA; American Dental Association Science and Research Institute, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Pazos I; Radiation Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Chow LC; American Dental Association Science and Research Institute, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States.
Publikováno v:
Inorganic chemistry [Inorg Chem] 2022 Aug 22; Vol. 61 (33), pp. 13022-13033. Date of Electronic Publication: 2022 Aug 05.
Autor:
Younan HC; Imperial College London, London, UK.; Hillingdon Hospital NHS Foundation Trust, Uxbridge, UK., Machin M; Imperial College London, London, UK., Myers AF; Imperial College London, London, UK.; Hillingdon Hospital NHS Foundation Trust, Uxbridge, UK., Slesser AAP; Imperial College London, London, UK.; Hillingdon Hospital NHS Foundation Trust, Uxbridge, UK., Mohsen Y; Imperial College London, London, UK.; Hillingdon Hospital NHS Foundation Trust, Uxbridge, UK.
Publikováno v:
Colorectal disease : the official journal of the Association of Coloproctology of Great Britain and Ireland [Colorectal Dis] 2020 Apr; Vol. 22 (4), pp. 373-381. Date of Electronic Publication: 2019 Jul 23.
Autor:
Schmucker SW; University of Maryland, College Park, Maryland 20742, USA., Namboodiri PN; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Kashid R; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Wang X; University of Maryland, College Park, Maryland 20742, USA., Hu B; University of Maryland, College Park, Maryland 20742, USA., Wyrick JE; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Myers AF; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Schumacher JD; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Silver RM; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Stewart MD Jr; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA.
Publikováno v:
Physical review applied [Phys Rev Appl] 2019; Vol. 11.
Autor:
Indhu, A. R.1 (AUTHOR), Dharanya, C.1 (AUTHOR), Dharmalingam, Gnanaprakash1 (AUTHOR) dgp@psgias.ac.in
Publikováno v:
Plasmonics. Jun2024, Vol. 19 Issue 3, p1303-1357. 55p.
Autor:
Moss, Perrin1,2 (AUTHOR) Perrin.Moss@health.qld.gov.au, Hartley, Nicole3 (AUTHOR), Russell, Trevor2,4 (AUTHOR)
Publikováno v:
BMC Health Services Research. 5/3/2024, Vol. 24 Issue 1, p1-21. 21p.
Autor:
Wu, Zengyuan1 (AUTHOR) wuzengyuan@cjlu.edu.cn, Zhao, Jiali1 (AUTHOR), Li, Ying1 (AUTHOR), Wang, Zelin1 (AUTHOR), He, Bin2 (AUTHOR), Chen, Liang3 (AUTHOR)
Publikováno v:
Scientific Reports. 4/26/2024, Vol. 14 Issue 1, p1-14. 14p.
Autor:
Zhang D; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA., Ha J; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA., Baek H; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Department of Physics and Astronomy, Seoul National University, Seoul, 151-747, Korea., Chan YH; Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan., Natterer FD; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland., Myers AF; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Schumacher JD; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Cullen WG; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA., Davydov AV; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Kuk Y; Department of Physics and Astronomy, Seoul National University, Seoul, 151-747, Korea., Chou MY; Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan.; School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA., Zhitenev NB; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Stroscio JA; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Publikováno v:
Physical review materials [Phys Rev Mater] 2017 Jul; Vol. 1 (2). Date of Electronic Publication: 2017 Jul 19.
Autor:
Deng X; School of Physics Science and Engineering, Tongji University, Shanghai 200092, People's Republic of China; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Namboodiri P; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Li K; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Wang X; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States; University of Maryland, College Park, Maryland 20740, United States., Stan G; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Myers AF; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Cheng X; School of Physics Science and Engineering, Tongji University, Shanghai 200092, People's Republic of China., Li T; School of Physics Science and Engineering, Tongji University, Shanghai 200092, People's Republic of China., Silver RM; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
Publikováno v:
Applied surface science [Appl Surf Sci] 2016 Aug 15; Vol. 378, pp. 301-307. Date of Electronic Publication: 2016 Mar 31.
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