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pro vyhledávání: '"Mutlu, Burcu O."'
Autor:
Jain, Milan, Mutlu, Burcu O., Stam, Caleb, Strube, Jan, Schupbach, Brian A., John, Jason M. St., Pellico, William A.
The Main Control Room of the Fermilab accelerator complex continuously gathers extensive time-series data from thousands of sensors monitoring the beam. However, unplanned events such as trips or voltage fluctuations often result in beam outages, cau
Externí odkaz:
http://arxiv.org/abs/2501.01509
Autor:
Mutlu, Burcu O.
Publikováno v:
TDX (Tesis Doctorals en Xarxa)
TDR. Tesis Doctorales en Red
Consejo Superior de Investigaciones Científicas (CSIC)
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
TDR. Tesis Doctorales en Red
Consejo Superior de Investigaciones Científicas (CSIC)
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's behavior. This has motivated the design of an array of techniques to detect, isolate, and correct soft errors using microarchitectural, architectural
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::05184057a2479167e9e16cc62188b8d3
https://hdl.handle.net/2117/18323510803/668904
https://hdl.handle.net/2117/18323510803/668904