Light Emission to Time Resolved Emission For IC Debug and Failure Analysis

Autor: Romain Desplats, Dean Lewis, J. Noel, Philippe Perdu, Sylvain Dudit, A. Pigozzi, Mustapha Remmach

Publikováno v: Microelectronics Reliability. 45:1476-1481

Light emission is routinely used to locate abnormal areas in failed ICs. Localization is done while the device is activated by a test pattern in a loop. Time Resolved Emission (TRE) has the potential to analyse faults by studying the emission of one

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9c02aeb647deff3e0911e85a8ecfedb5
https://doi.org/10.1016/j.microrel.2005.07.034

Application of various optical techniques for ESD defect localization

Autor: Mustapha Remmach, Frédéric Darracq, F. Essely, Vincent Pouget, Felix Beaudoin, Marise Bafleur, Philippe Perdu, Nicolas Guitard, Andre Touboul, Dean Lewis

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2006, 46 (9-11), pp.1563-1568, 10.1016/j.microrel.2006.07.021. ⟨10.1016/j.microrel.2006.07.021⟩
Microelectronics Reliability, 2006, 46 (9-11), pp.1563-1568, 10.1016/j.microrel.2006.07.021. ⟨10.1016/j.microrel.2006.07.021⟩

International audience; Various optical defect localization techniques are applied on the same integrated circuits (IC). These circuits were previously stressed by Electro Static Discharges (ESD) to create defects. The results obtained by each techni

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::93fdcea72497f40ca83ab72e1b6677f9
https://hal.archives-ouvertes.fr/hal-00204570

Light emission and TRE for a 120 nm technology case study: how much wavelength shift?

Autor: Michel Vallet, Sylvain Dudit, Romain Desplats, J. P. Roux, Philippe Perdu, Mustapha Remmach, P. Sardin

Publikováno v: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).

After a brief review of light emission in field effect transistors, we extract some electrical and physical parameters linked to the emission of photons such as V/sub DD/ and channel length. Using 120 nm technology structures (nMOS, pMOS, inverters,

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cc29698d326cabaf79e01a813f73c4cb
https://doi.org/10.1109/ipfa.2004.1345570

Implementation of TRE systems into Emission Microscopes

Autor: Mustapha Remmach, Alberto Tosi, Franco Zappa, Romain Desplats, Philippe Perdu

Time-Resolved photon Emission (TRE) has the potential to identify faults by analysing the luminescence emission, as a function of time. TRE detectors provide time capabilities, but they have the disadvantage to be a single-point measurement, with no

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6dc3b1d4db3b50cf2554e26fa38b1b3d
http://hdl.handle.net/11311/555696