Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Musgrave, C. B."'
Autor:
Khalil, M. S., Stoutimore, M. J. A., Gladchenko, S., Holder, A. M., Musgrave, C. B., Kozen, A. C., Rubloff, G., Liu, Y. Q., Gordon, R. G., Yum, J. H., Banerjee, S. K., Lobb, C. J., Osborn, K. D.
Publikováno v:
Appl. Phys. Lett. 103, 162601 (2013)
Two-level system (TLS) defects in dielectrics are known to limit the performance of electronic devices. We study TLS using millikelvin microwave loss measurements of three atomic layer deposited (ALD) oxide films--crystalline BeO ($\rm{c-BeO}$), amor
Externí odkaz:
http://arxiv.org/abs/1307.7664
Publikováno v:
MRS Online Proceedings Library; 2000, Vol. 610 Issue 1, p1-6, 6p
Autor:
Solares, S. D., Dasgupta, S., Schultz, P. A., Kim, Y.-H., Musgrave, C. B., Goddard, W. A., III
Publikováno v:
Langmuir; December 2005, Vol. 21 Issue: 26 p12404-12414, 11p
Publikováno v:
Chemistry of Materials; September 2005, Vol. 17 Issue: 21 p5305-5314, 10p
Publikováno v:
Langmuir; August 2004, Vol. 20 Issue: 18 p7604-7609, 6p
Autor:
Xu, Y., Musgrave, C. B.
Publikováno v:
Chemistry of Materials; February 2004, Vol. 16 Issue: 4 p646-653, 8p
Publikováno v:
The Journal of Physical Chemistry - Part B; March 2002, Vol. 106 Issue: 10 p2643-2648, 6p
Publikováno v:
The Journal of Physical Chemistry - Part B; December 2001, Vol. 105 Issue: 50 p12583-12595, 13p
Publikováno v:
The Journal of Physical Chemistry - Part B; December 2001, Vol. 105 Issue: 50 p12559-12565, 7p
Publikováno v:
The Journal of Physical Chemistry - Part B; December 2001, Vol. 105 Issue: 48 p12068-12075, 8p