Zobrazeno 1 - 10
of 31
pro vyhledávání: '"Muriel Thomasset"'
Publikováno v:
The Review of scientific instruments. 90(2)
Stitching methods are increasingly used for determining the surface shape of large and high precision optical elements used in synchrotron beamlines. They consist in reconstructing the surface topography from multiple measurements on overlapping part
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5ea7a7ad8ed32e3e7cef1ea6a9fb3fe3
https://pubmed.ncbi.nlm.nih.gov/30831756
https://pubmed.ncbi.nlm.nih.gov/30831756
Autor:
Philippe Barre, Vincent Gensollen, Sabrina Delaunay, Frédéric Lafaillette, Muriel Thomasset, Bernadette Julier, Paola Lambroni
Publikováno v:
Molecular Breeding
Molecular Breeding, Springer Verlag, 2018, 38 (11), pp.1-12. ⟨10.1007/s11032-018-0891-1⟩
Molecular Breeding, Springer Verlag, 2018, 38 (11), pp.1-12. ⟨10.1007/s11032-018-0891-1⟩
International audience; Variety registration of lucerne often fails because of the difficulty to pass the distinction test. This test is presently based on phenotypic traits. We proposed to evaluate if high-throughput genotyping of varieties with gen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ba7a723c9ae6f58aa55b886dafd0f716
https://doi.org/10.1007/s11032-018-0891-1
https://doi.org/10.1007/s11032-018-0891-1
Autor:
Joe H. Sullivan, Jonathan Manton, Janet Y. Sheung, Lahsen Assoufid, Muriel Thomasset, Jun Qian, Joseph Dvorak, Péter Takács, Sunil Bean
Publikováno v:
Advances in Metrology for X-Ray and EUV Optics VII.
As resolving power targets have increased with each generation of beamlines commissioned in synchrotron radiation facilities worldwide, diffraction gratings are quickly becoming crucial optical components for meeting performance targets. However, the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bca1d93ef348f59dc9bc09b5c9310ea7
https://doi.org/10.1117/12.2279053
https://doi.org/10.1117/12.2279053
Autor:
Josep Nicolas, Chao Zuo, Lei Huang, Kashmira Tayabaly, Tianyi Wang, Amparo Vivo, Muriel Thomasset, François Polack, Mourad Idir, Dae Wook Kim
Publikováno v:
'Optics Express ', vol: 27, pages: 26940-26956 (2019)
Stitching interferometry is performed by collecting interferometric data from overlapped sub-apertures and stitching these data together to provide a full surface map. The propagation of the systematic error in the measured subset data is one of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::abd091f4b1cd3ccc63e2369f0803ff47
https://doi.org/10.1364/oe.27.026940
https://doi.org/10.1364/oe.27.026940
Publikováno v:
Review of Scientific Instruments. 90:021714
Diffraction gratings are key elements of soft X-ray synchrotron beamlines. Besides wavelength dispersion, specific parameters can be tailored to adjust the energy dependent efficiency and focusing, and to correct wavefront aberrations. As key element
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8d431ad0c6d7a6657c604a1031eb1b9e
https://doi.org/10.1063/1.5055284
https://doi.org/10.1063/1.5055284
Autor:
François Polack, Muriel Thomasset
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 710:67-71
When trying to measure an optical surface at utmost absolute precision, the problem of the missing or unknown “reference surface” is often encountered. It is obvious with Fizeau and Michelson's interferometry, where the height difference between
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be1136e4c1d7f0d8e562cc71e8c7b0e6
https://doi.org/10.1016/j.nima.2012.10.134
https://doi.org/10.1016/j.nima.2012.10.134
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 710:7-12
Characterizing nanofocusing X-ray mirrors for the soon coming nano-imaging beamlines of synchrotron light sources motivates the development of new instruments with improved performances. The sensitivity and accuracy goal is now fixed well under the n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::baada4e33ae4307d86f42045b0bd21e9
https://doi.org/10.1016/j.nima.2012.10.123
https://doi.org/10.1016/j.nima.2012.10.123
Autor:
Juan F. Fernández-Manjarrés, Paola Bertolino, Gerry C. Douglas, Nathalie Frascaria-Lacoste, Muriel Thomasset, Trevor R. Hodkinson
Publikováno v:
European Journal of Forest Research. 132:195-209
Large-scale reforestation programmes are a major source of unwarranted gene flow and can have profound consequences on local genetic diversity. Recently, ash has been introduced to Ireland from continental Europe to stock plantations but has often ex
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2437cc390f79b3df377a454d202fd51b
https://doi.org/10.1007/s10342-012-0667-9
https://doi.org/10.1007/s10342-012-0667-9
Autor:
David Dennetiere, Blandine Capitanio, Muriel Thomasset, Franck Delmotte, Evgueni Meltchakov, Catherine Burcklen, Regina Soufli, Philippe Fontaine, Gianluca Ciatto, François Polack
Publikováno v:
Workshop PXRNMS-2016 (Physics of X-Ray and Neutron Multilayer Structures)
Workshop PXRNMS-2016 (Physics of X-Ray and Neutron Multilayer Structures), MESA+ Institute for Nanotechnology of the University of Twente, Enschede, The Netherlands, Nov 2016, Enschede, Netherlands
HAL
Workshop PXRNMS-2016 (Physics of X-Ray and Neutron Multilayer Structures), MESA+ Institute for Nanotechnology of the University of Twente, Enschede, The Netherlands, Nov 2016, Enschede, Netherlands
HAL
International audience; Sirius is a beamline designed for studying soft interfaces and semiconductor or magnetic nanostructures. It has recently got a new multilayer grating monochromator covering the 1 – 4 keV band which complements its already ex
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::e95f3414395d0f3efe55679c5dd7fe8a
https://hal.archives-ouvertes.fr/hal-01686279
https://hal.archives-ouvertes.fr/hal-01686279
Autor:
Evgueni Meltchakov, Franck Delmotte, Regina Soufli, Muriel Thomasset, A. Jérome, François Polack, Catherine Burcklen, D. Dennetiere, Eric M. Gullikson, B. Capitanio, S. de Rossi
Publikováno v:
Journal of Applied Physics, vol 119, iss 12
Journal of Applied Physics
Journal of Applied Physics, American Institute of Physics, 2016, 119 (12), pp.125307 ⟨10.1063/1.4944723⟩
Journal of Applied Physics
Journal of Applied Physics, American Institute of Physics, 2016, 119 (12), pp.125307 ⟨10.1063/1.4944723⟩
International audience; We present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B4C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by mag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5813d1193d81b6515e737686555348cc
https://escholarship.org/uc/item/3fd7k25z
https://escholarship.org/uc/item/3fd7k25z