Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Muravsky, L.I."'
Publikováno v:
In Optics and Lasers in Engineering 2011 49(3):305-312
Autor:
Kostyukevych, S.O., Muravsky, L.I., Fitio, V.M., Voronyak, T.I., Shepeliavyi, P.E., Kostyukevych, K.V., Moskalenko, N.L., Pogoda, V.I.
The new approach for creation of film reflecting holographic marks for optical security is proposed. Such marks are replicas of a reflecting master hologram recorded on a chalcogenide glass layer. To receive the master hologram, the joint power spect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::938768d0860236a2a82391746da1ddbd
http://dspace.nbuv.gov.ua/handle/123456789/117761
http://dspace.nbuv.gov.ua/handle/123456789/117761
Autor:
Muravsky, L.I., Kulynych, Ya.P., Maksymenko, O.P., Voronyak, T.I., Pogan, L.Y., Vladimirov, F.L., Kostyukevych, S.A., Fitio, V.M.
Performance of optical and hybrid joint transform correlators (JTCs) for security verification of optical marks containing transformed phase masks (PMs) is studied. The peak-to-noise ratio (PNR) and relative intensity of correlation peaks are selecte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::3e68f5ba4558b0f0d47775ab5a2ad89d
http://dspace.nbuv.gov.ua/handle/123456789/121189
http://dspace.nbuv.gov.ua/handle/123456789/121189
Publikováno v:
Metallurgical & Materials Transactions. Part A; Jan2018, Vol. 49 Issue 1, p117-127, 11p, 1 Color Photograph, 4 Diagrams, 12 Graphs
Autor:
Abou Nader, Christelle1 abounaderchristelle@gmail.com, Tualle, Jean-Michel1, Tinet, Eric1, Ettori, Dominique1
Publikováno v:
Sensors (14248220). Feb2019, Vol. 19 Issue 3, p497. 1p.
Autor:
Odinokov, S., Sherbinin, M.
Publikováno v:
Optical Memory & Neural Networks; Dec2008, Vol. 17 Issue 4, p263-270, 8p
Autor:
Odinokov, S.
Publikováno v:
Optical Memory & Neural Networks; Sep2008, Vol. 17 Issue 3, p220-231, 12p
This book reports on new theories and applications in the field of intelligent systems and computing. It covers cutting-edge computational and artificial intelligence methods, advances in computer vision, big data, cloud computing, and computation li
Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-dest
Autor:
Renfu Lu
Light Scattering Technology for Food Property, Quality and Safety Assessment discusses the development and application of various light scattering techniques for measuring the structural and rheological properties of food, evaluating composition and