Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Murat, Pak"'
Publikováno v:
Micro and Nano Engineering, Vol 10, Iss , Pp 100082- (2021)
Spin-transfer torque magnetic random-access memory (STT-MRAM) is considered as the most promising candidate to replace the complementary metal-oxide-semiconductor (CMOS) based memories that are dominating the market in the last few decades. What make
Externí odkaz:
https://doaj.org/article/fd3962a88053445a8b4d3b9c83130821
Autor:
Murat Pak, Xiu Mei Xu, Efrain Altamirano Sanchez, Christie Delvaux, Farid Sebaai, Geert Mannaert
Publikováno v:
Solid State Phenomena. 314:167-171
Test structure development is critical for single wafer pattern collapse evaluations. A good test vehicle not only allows optimization and benchmarking of different processes, but also facilitates understanding of the underlying mechanism. For high a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::647f9bb844ae16b1600c8c31ba7833cb
https://doi.org/10.4028/www.scientific.net/ssp.314.167
https://doi.org/10.4028/www.scientific.net/ssp.314.167
Autor:
Murat Pak, Wesley Zanders, Patrick Wong, Sandip Halder, Romuald Blanc, Laurent Souriau, Jeonghoon Lee, Gouri Sankar Kar
Publikováno v:
Optical and EUV Nanolithography XXXV.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eed0381dc083f05d6188317cdb97ffc6
https://doi.org/10.1117/12.2618761
https://doi.org/10.1117/12.2618761
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
instname
This paper proposes a novel yield-aware optimization methodology that can be used for mixed-domain synthesis of robust micro-electro-mechanical systems (MEMS). The robust Pareto front optimization of a MEMS accelerometer system, which includes a capa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e7d2aef9b83f0c667eff684bacfdeff
http://hdl.handle.net/10261/230333
http://hdl.handle.net/10261/230333
Autor:
Sandip Halder, Murat Pak, Danilo De Simone, Monique Ercken, Gouri Sankar Kar, D. Crotti, Pieter Vanelderen, Farrukh Yasin, Hubert Hody, Laurent Souriau
Publikováno v:
Extreme Ultraviolet (EUV) Lithography X.
The read performance of a spin-transfer torque magnetic random-access memory device is based on the tunnel magnetoresistance of the magnetic tunnel junction cell, which is a function of the resistance values at low and high resistance states of the m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b3bd6620483707fcb9c11438b73c0382
https://doi.org/10.1117/12.2515023
https://doi.org/10.1117/12.2515023
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
instname
This paper proposes a novel optimization-based design methodology that can be used for mixed-domain synthesis of MEMS accelerometers. Several problems have been identified with existing methodologies and comparative experiments that demonstrate the s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85be0314106cf3d100c67f5ce746a457
http://hdl.handle.net/10261/169334
http://hdl.handle.net/10261/169334
Publikováno v:
SMACD
This paper focuses on the optimization of a fixed-topology MEMS accelerometer sensor using the MOEA/D evolutionary algorithm. Several methodologies have been implemented for the optimization of MEMS sensors. These techniques are either based on sweep
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29a6fc5ac1160df061a6ed97677d2547
https://doi.org/10.1109/smacd.2017.7981574
https://doi.org/10.1109/smacd.2017.7981574
Publikováno v:
International Symposium on Microelectronics. 2012:000702-000709
As the development of the ULSI technique with respect to the decrease in the feature sizes, critical dimension has become a vital parameter for the IC manufacturing. For sub-micron technologies, there has always been a significant mismatch between th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77466aef5071c731b9af8754adc4e7d6
https://doi.org/10.4071/isom-2012-wa56
https://doi.org/10.4071/isom-2012-wa56
Publikováno v:
International Symposium on Microelectronics. 2012:000694-000701
Stabilization after the lithography process is crucial in order to prevent deformation of photoresist patterns by other thermal processes used in semiconductor production. UV hardening is capable of minimizing negative effects of thermal processes su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::894372a09a43ff04ca104f5ce11db920
https://doi.org/10.4071/isom-2012-wa55
https://doi.org/10.4071/isom-2012-wa55
Publikováno v:
2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).
This paper focuses on the implementation of different techniques for the integration of yield in the synthesis loop of analog ICs. Several algorithms have been developed for multi-objective optimization. Among these optimizers, MOEA/D (Multi-Objectiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68117a444109d2e1b29d517ab7f347df
https://doi.org/10.1109/smacd.2015.7301705
https://doi.org/10.1109/smacd.2015.7301705