Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Murari Mani"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 26:1790-1802
Variability in process parameters leads to a significant parametric yield loss of high-performance ICs due to the large spread in leakage-power consumption and speed of chips. In this paper, we propose an algorithm for total power minimization under
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ebd51fdced4f022eae30aaf00258ee9
https://doi.org/10.1109/tcad.2007.895797
https://doi.org/10.1109/tcad.2007.895797
Publikováno v:
ISQED
In this paper, we present an efficient algorithm for large-scale leakage optimization under sign-off timing constraints using the technique of multiple voltage threshold (multi-Vt) assignment. Several practical considerations are addressed, such as t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c118bf2709c5ca479a877475c0bc44f
https://doi.org/10.1109/isqed.2015.7085395
https://doi.org/10.1109/isqed.2015.7085395
Publikováno v:
2010 IEEE Dallas Circuits and Systems Workshop.
In many digital designs, multi-stage tapered buffers are needed to drive large capacitive loads. These buffers contribute a significant percentage of overall power. In this paper, we propose two novel tunable buffer designs that enable power reductio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a922b01643b4083c7d12b692deddc9f0
https://doi.org/10.1109/dcas.2010.5955033
https://doi.org/10.1109/dcas.2010.5955033
Autor:
Murari Mani, Michael Orshansky
Publikováno v:
Closing the Power Gap Between ASIC & Custom ISBN: 9780387257631
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20df97603f4781089e4f527db0f0dc5f
https://doi.org/10.1007/978-0-387-68953-1_12
https://doi.org/10.1007/978-0-387-68953-1_12
Publikováno v:
ACM Great Lakes Symposium on VLSI
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interior-point solution method. The new solution method is capable of solving
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e3b8e713c78a5b826a08d34a165ce33
https://doi.org/10.1145/1127908.1127993
https://doi.org/10.1145/1127908.1127993
Publikováno v:
DAC
The gain-based technology mapping paradigm has been successfully employed for finding minimum delay and minimum area mappings. However, existing gain-based technology mappers fail to find circuits with minimal leakage power. In this paper, we introdu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51331df61e1ad81192b16e45b9f42cde
https://doi.org/10.1145/1146909.1147046
https://doi.org/10.1145/1146909.1147046
Publikováno v:
ICCAD
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable parameters. The two levels of tuning operate within a single variabili
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e7d148f4711fe9cbc9227dcf5b48d27
https://doi.org/10.1145/1233501.1233507
https://doi.org/10.1145/1233501.1233507
Publikováno v:
DAC
Power minimization under variability is formulated as a rigorous statistical robust optimization program with a guarantee of power and timing yields. Both power and timing metrics are treated probabilistically. Power reduction is performed by simulta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49cfc186c5bb0f40772f39539f78bb65
https://doi.org/10.1145/1065579.1065661
https://doi.org/10.1145/1065579.1065661
Autor:
Michael Orshansky, Murari Mani
Publikováno v:
ICCD
In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nanometer regime. We present a statistical sizing approach that takes into ac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab4959ec03ebee6c793b8f6408d3f575
https://doi.org/10.1109/iccd.2004.1347933
https://doi.org/10.1109/iccd.2004.1347933