Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Murakhovski, A. V."'
Autor:
Kolupaev, I. N., Sobol, O. V., Murakhovski, A. V., Koltsova, T. S., Kozlova, M. V., Sobol, V. O.
Multi-threshold slices of an intensity of the optical images of the surface were used for a quantitative assessment of physical and chemical processes on the covering. Computer analysis was applied for testing the real relief by correlation of the im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3033::5d381e3b7d5938cef08ede3adefbbde3
http://repository.kpi.kharkov.ua/handle/KhPI-Press/59147
http://repository.kpi.kharkov.ua/handle/KhPI-Press/59147
Publikováno v:
Journal of Nano- & Electronic Physics; 2018, Vol. 10 Issue 2, p1-6, 6p
