Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Muhammad Adil Ansari"'
Publikováno v:
IEEE Access, Vol 9, Pp 96700-96710 (2021)
The application diversity and evolution of AI accelerator architectures require innovative DFT solutions to address issues such as test time, test power, performance and area overhead. Full scan DFT, because of its enhanced controllability and observ
Externí odkaz:
https://doaj.org/article/4c17aae9c20640678c7c6ef41f7be6eb
Publikováno v:
Mehran University Research Journal of Engineering and Technology, Vol 30, Iss 3, Pp 371-382 (2011)
Autonomous robots are intelligent machines that are capable of performing desired tasks by themselves, without explicit human control. This paper presents design and implementation of the ASVR (Autonomous Sonar Based Vehicle Robot). ASVR is a micr
Externí odkaz:
https://doaj.org/article/ed05b42782614aa89223e62c6f9de74a
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:2728-2738
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::935cc4432471b3435823a6eb2c47f600
https://doi.org/10.1109/tcad.2021.3110739
https://doi.org/10.1109/tcad.2021.3110739
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 69:1537-1541
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc8291d4fedffbdf9db1e79a27bccc53
https://doi.org/10.1109/tcsii.2021.3108415
https://doi.org/10.1109/tcsii.2021.3108415
Publikováno v:
IEEE Access, Vol 9, Pp 96700-96710 (2021)
The application diversity and evolution of AI accelerator architectures require innovative DFT solutions to address issues such as test time, test power, performance and area overhead. Full scan DFT, because of its enhanced controllability and observ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9fae846d0715ec0368c3e9566d7ac173
https://ieeexplore.ieee.org/document/9474346/
https://ieeexplore.ieee.org/document/9474346/
Autor:
Ehsan Ali Buriro, Ahsin Murtaza Bughio, Nasreen Nizamani, Muhammad Adil Ansari, Shahid Hussain Siyal
Publikováno v:
Quaid-e-Awam University Research Journal of Engineering, Science & Technology. 18:133-137
The magnetic tunnel junction based on magnesium oxide is a device consisting of two ferromagnetic layers separated by the insulating layer of magnesium oxide which has proved to be the foundation of contemporary magnetic read sensors in hard disk dri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d51caf221e60f346b97070c4eb048909
https://doi.org/10.52584/qrj.1802.19
https://doi.org/10.52584/qrj.1802.19
Publikováno v:
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE. 19:87-96
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c268bbf118f266b12a3b014e8a48f121
https://doi.org/10.5573/jsts.2019.19.1.087
https://doi.org/10.5573/jsts.2019.19.1.087
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37:1681-1691
The reconfigurable scan network standardized by IEEE std. 1687 offers flexibility in accessing the on-chip instruments, which significantly improves the test cost. In this paper, we present a novel time-multiplexed 1687-network architecture that sign
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7313533214c3a90af8b530d86beef1ac
https://doi.org/10.1109/tcad.2017.2766146
https://doi.org/10.1109/tcad.2017.2766146
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 64:822-826
Semiconductor aging is a serious threat to the reliability of a system. We address the aging level of semiconductor components by describing the degree of semiconductor aging under certain operating conditions, including voltage, frequency, temperatu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e1d176137384be87ebb9cbf17d5e083
https://doi.org/10.1109/tcsii.2016.2601959
https://doi.org/10.1109/tcsii.2016.2601959
Autor:
Inamullah Sario, Aafia Meherban Kamboh, Ranjeet Kumar Nangdev, Abdul Bari Channa, Muhammad Adil Ansari, Farhan Ali Qureshi
Publikováno v:
2019 2nd International Conference on Computing, Mathematics and Engineering Technologies (iCoMET).
VLSI circuits in automotive fields deal with excessive heat and workload that is why aging of semiconductor devices become rapid that reduces the reliability and life span of the corresponding system. Aging monitoring of such circuits helps avoiding
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a074932803efdfdb53c5931a4340e62
https://doi.org/10.1109/icomet.2019.8673402
https://doi.org/10.1109/icomet.2019.8673402