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pro vyhledávání: '"Mueller, Heinz"'
Autor:
Çelik, Ahmet, Shirsath, Akash Bhimrao, Syla, Fatjon, Müller, Heinz, Lott, Patrick, Deutschmann, Olaf
Publikováno v:
In Journal of Analytical and Applied Pyrolysis August 2024 181
Autor:
Mokashi, Manas, Shirsath, Akash Bhimrao, Çelik, Ahmet, Lott, Patrick, Müller, Heinz, Tischer, Steffen, Maier, Lubow, Bode, Johannes, Schlereth, David, Scheiff, Frederik, Flick, Dieter, Bender, Michael, Ehrhardt, Kai, Deutschmann, Olaf
Publikováno v:
In Chemical Engineering Journal 1 April 2024 485
Autor:
Mokashi, Manas, Bhimrao Shirsath, Akash, Lott, Patrick, Müller, Heinz, Tischer, Steffen, Maier, Lubow, Deutschmann, Olaf
Publikováno v:
In Chemical Engineering Journal 1 January 2024 479
Publikováno v:
Europhys. Lett. 55, 253-259 (2001).
Background charge rearrangements in metallic single-electron transistors are modelled in two-level tunnelling systems as a Poisson process with a scale parameter as only variable. The model explains the recent observation of asymmetric Coulomb blocka
Externí odkaz:
http://arxiv.org/abs/cond-mat/0012426