Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Muckley ES"'
Autor:
Rebello NJ; Department of Chemical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Arora A; Department of Chemical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Mochigase H; Department of Chemical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Lin TS; Department of Chemical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Shi J; Department of Chemical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Audus DJ; Materials Science and Engineering Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States., Muckley ES; Citrine Informatics, Redwood City, California 94063-2483, United States., Osmani A; Department of Chemical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States., Olsen BD; Department of Chemical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.
Publikováno v:
Journal of chemical information and modeling [J Chem Inf Model] 2024 Aug 26; Vol. 64 (16), pp. 6464-6476. Date of Electronic Publication: 2024 Aug 10.
Autor:
Muckley ES; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States., Vasudevan R; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States., Sumpter BG; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States., Advincula RC; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States., Ivanov IN; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2023 Jan 11; Vol. 15 (1), pp. 2329-2340. Date of Electronic Publication: 2022 Dec 28.
Autor:
Spagnolo S; Faculty of Mathematics, Physics and Informatics, Comenius University, Mlynska dolina F1, 842 48 Bratislava, Slovakia. tibor.hianik@fmph.uniba.sk., Muckley ES; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6496, USA., Ivanov IN; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6496, USA., Hianik T; Faculty of Mathematics, Physics and Informatics, Comenius University, Mlynska dolina F1, 842 48 Bratislava, Slovakia. tibor.hianik@fmph.uniba.sk.
Publikováno v:
The Analyst [Analyst] 2022 Jan 31; Vol. 147 (3), pp. 461-470. Date of Electronic Publication: 2022 Jan 31.
Autor:
Kim D; Joint Institute for Advanced Materials, Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA., Muckley ES; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Creange N; Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27606, USA., Wan TH; Department of Mechanical and Aerospace Engineering, The Hong Kong University of Science and Technology, Hong Kong., Ann MH; Department of Molecular Science and Technology, Ajou University, Suwon, 16499, Republic of Korea., Quattrocchi E; Department of Mechanical and Aerospace Engineering, The Hong Kong University of Science and Technology, Hong Kong., Vasudevan RK; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Kim JH; Department of Molecular Science and Technology, Ajou University, Suwon, 16499, Republic of Korea., Ciucci F; Department of Mechanical and Aerospace Engineering, The Hong Kong University of Science and Technology, Hong Kong.; Department of Chemical and Biomolecular Engineering, The Hong Kong University of Science and Technology, Hong Kong., Ivanov IN; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Kalinin SV; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Ahmadi M; Joint Institute for Advanced Materials, Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA.
Publikováno v:
Advanced science (Weinheim, Baden-Wurttemberg, Germany) [Adv Sci (Weinh)] 2021 Aug; Vol. 8 (15), pp. e2002510. Date of Electronic Publication: 2021 Jun 21.
Autor:
Galuska LA; Center for Optoelectronic Materials and Devices, School of Polymer Science and Engineering, University of Southern Mississippi, Hattiesburg, MS, 39406, USA., Muckley ES; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA., Cao Z; Center for Optoelectronic Materials and Devices, School of Polymer Science and Engineering, University of Southern Mississippi, Hattiesburg, MS, 39406, USA., Ehlenberg DF; Center for Optoelectronic Materials and Devices, School of Polymer Science and Engineering, University of Southern Mississippi, Hattiesburg, MS, 39406, USA., Qian Z; Center for Optoelectronic Materials and Devices, School of Polymer Science and Engineering, University of Southern Mississippi, Hattiesburg, MS, 39406, USA., Zhang S; Center for Optoelectronic Materials and Devices, School of Polymer Science and Engineering, University of Southern Mississippi, Hattiesburg, MS, 39406, USA., Rondeau-Gagné S; Department of Chemistry and Biochemistry, University of Windsor, Windsor, ON, Canada, N9B3P4., Phan MD; Neutron Scattering Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA., Ankner JF; Neutron Scattering Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA., Ivanov IN; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA., Gu X; Center for Optoelectronic Materials and Devices, School of Polymer Science and Engineering, University of Southern Mississippi, Hattiesburg, MS, 39406, USA. xiaodan.gu@usm.edu.
Publikováno v:
Nature communications [Nat Commun] 2021 Apr 20; Vol. 12 (1), pp. 2347. Date of Electronic Publication: 2021 Apr 20.
Autor:
Collins L; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Muckley ES; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Tsai H; Materials Physics and Application Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States., Ghosh D; Materials Physics and Application Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States., Neukirch AJ; Materials Physics and Application Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States., Tretiak S; Materials Physics and Application Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States., Kalinin SV; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Nie W; Materials Physics and Application Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States., Ivanov IN; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2020 Apr 01; Vol. 12 (13), pp. 15380-15388. Date of Electronic Publication: 2020 Mar 20.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2019 Dec 26; Vol. 11 (51), pp. 48466-48475. Date of Electronic Publication: 2019 Dec 10.
Autor:
Ahmadi M, Muckley ES, Ivanov IN, Lorenz M, Li X, Ovchinnikova O, Lukosi ED, Tisdale JT, Blount E, Kravchenko II, Kalinin SV, Hu B, Collins L
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2019 Apr 24; Vol. 11 (16), pp. 14722-14733. Date of Electronic Publication: 2019 Apr 12.
Autor:
Muckley ES; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, USA. muckleyes@ornl.gov ivanovin@ornl.gov., Naguib M, Ivanov IN
Publikováno v:
Nanoscale [Nanoscale] 2018 Nov 29; Vol. 10 (46), pp. 21689-21695.
Autor:
Muckley ES; Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , P.O. Box 2008, Oak Ridge , Tennessee 37831-6496 , United States., Collins L; Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , P.O. Box 2008, Oak Ridge , Tennessee 37831-6496 , United States., Ievlev AV; Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , P.O. Box 2008, Oak Ridge , Tennessee 37831-6496 , United States., Ye X; Center for Functional Nanomaterials , Brookhaven National Laboratory , Upton , New York 11973 , United States., Kisslinger K; Center for Functional Nanomaterials , Brookhaven National Laboratory , Upton , New York 11973 , United States., Sumpter BG; Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , P.O. Box 2008, Oak Ridge , Tennessee 37831-6496 , United States., Lavrik NV; Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , P.O. Box 2008, Oak Ridge , Tennessee 37831-6496 , United States., Nam CY; Center for Functional Nanomaterials , Brookhaven National Laboratory , Upton , New York 11973 , United States., Ivanov IN; Center for Nanophase Materials Sciences , Oak Ridge National Laboratory , P.O. Box 2008, Oak Ridge , Tennessee 37831-6496 , United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2018 Sep 19; Vol. 10 (37), pp. 31745-31754. Date of Electronic Publication: 2018 Sep 05.