Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Mu-Chi Chiang"'
Autor:
Jonathan Chang, Yen-Huei Chen, Wei-Min Chan, Sahil Preet Singh, Hank Cheng, Hidehiro Fujiwara, Jih-Yu Lin, Kao-Cheng Lin, John Hung, Robin Lee, Hung-Jen Liao, Jhon-Jhy Liaw, Quincy Li, Chih-Yung Lin, Mu-Chi Chiang, Shien-Yang Wu
Publikováno v:
2017 IEEE International Solid-State Circuits Conference (ISSCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::767fe9e873b7144ea10dcc2b8bc11961
https://doi.org/10.1109/isscc.2017.7870333
https://doi.org/10.1109/isscc.2017.7870333
Autor:
Shien Yang Wu, Wen-Cheng Lo, Lin Chih-Yung, Chun-Yen Chang, Sun Jay Chang, Tien-Sheng Chao, Mu Chi Chiang
Publikováno v:
Japanese Journal of Applied Physics. 46:1124-1128
In this study, we compared the effects of negative-bias temperature instability (NBTI) and hot-carrier injection (HCI) on the core and input/output (I/O) p-channel metal–oxide–semiconductor field-effect transistor (PMOSFET) fabricated using the d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d0b644a1f0d8d1f67acd1c6b7d86a078
https://doi.org/10.1143/jjap.46.1124
https://doi.org/10.1143/jjap.46.1124
Autor:
Yen-Huei Chen, Wei-Min Chan, Wei-Cheng Wu, Hung-Jen Liao, Kuo-Hua Pan, Jhon-Jhy Liaw, Tang-Hsuan Chung, Quincy Li, George H. Chang, Chih-Yung Lin, Mu-Chi Chiang, Shien-Yang Wu, Sreedhar Natarajan, Jonathan Chang
Publikováno v:
2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73a2f3c01158a98a42cc5905dc1cc115
https://doi.org/10.1109/isscc.2014.6757416
https://doi.org/10.1109/isscc.2014.6757416