Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Mozuelos, R."'
Publikováno v:
In Microelectronics Journal May 2013 44(5):382-392
Publikováno v:
In Microelectronics Journal December 2005 36(12):1064-1072
Publikováno v:
Proc. of 23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08)
23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Grenoble, France, November 12-14
23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Grenoble, France, November 12-14, Nov 2008, Grenoble, France. pp.session 1D2
23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08)
23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Nov 2008, France. pp.0
23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Grenoble, France, November 12-14
23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Grenoble, France, November 12-14, Nov 2008, Grenoble, France. pp.session 1D2
23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08)
23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Nov 2008, France. pp.0
ISBN : 978-2-84813-124-5; International audience; This paper presents a Design-for-Test method for folded and interpolated analog-to-digital converters. The test approach samples relative voltage deviations among internal circuit nodes. A fault simul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::57e9aa880002e4bd22a05025975f031d
https://hal.archives-ouvertes.fr/hal-00347714
https://hal.archives-ouvertes.fr/hal-00347714
Publikováno v:
Proceedings of the 4th IEEE International Mixed Signal Testing Workshop (IMSTW), 174-177
STARTPAGE=174;ENDPAGE=177;TITLE=Proceedings of the 4th IEEE International Mixed Signal Testing Workshop (IMSTW)
STARTPAGE=174;ENDPAGE=177;TITLE=Proceedings of the 4th IEEE International Mixed Signal Testing Workshop (IMSTW)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=narcis______::d154b01955453a93f53f8f3ceb997d12
https://research.utwente.nl/en/publications/builtin-dynamic-current-testing-of-an-operational-amplifier-in-a-sea-of-gates-technology(c157d10b-9872-43f4-80d1-a1783c658006).html
https://research.utwente.nl/en/publications/builtin-dynamic-current-testing-of-an-operational-amplifier-in-a-sea-of-gates-technology(c157d10b-9872-43f4-80d1-a1783c658006).html
Publikováno v:
Technological Innovation for the Internet of Things; 2013, p164-171, 8p
Publikováno v:
2011 IEEE 14th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 2011, p35-40, 6p
Publikováno v:
2010 15th IEEE European Test Symposium (ETS); 2010, p164-169, 6p
Publikováno v:
2007 14th IEEE International Conference on Electronics, Circuits & Systems; 2007, p226-229, 4p
Publikováno v:
Proceedings 2002 Design, Automation & Test in Europe Conference & Exhibition; 2002, p205-211, 7p
Akademický článek
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