Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Moyra K. McManus"'
Autor:
Weimin Gao, Nakgeuon Seong, Moyra K. McManus, Shih En Tseng, Anthony Yen, Tsann-Bim Chiou, Pieter Woltgens
Publikováno v:
Extreme Ultraviolet (EUV) Lithography XI.
We explore various resolution enhancement techniques and investigate their patterning benefits for via patterns of the 3-nm logic node using computational lithography. Simulations are performed by the method of source mask optimization (SMO) using th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::522753e4e6ab39f8292175adcf48ed3a
https://doi.org/10.1117/12.2552888
https://doi.org/10.1117/12.2552888
Publikováno v:
IEEE Transactions on Electron Devices. 51:1455-1462
In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integrat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db4fdd4c86172ca313762f26e6a2a169
https://doi.org/10.1109/ted.2004.833967
https://doi.org/10.1109/ted.2004.833967
Autor:
Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran Chatty, Mujahid Muhammad, Pia Sanda
Publikováno v:
EDFA Technical Articles. 6:20-30
Latchup has long been a concern for CMOS technologies and is becoming more of an issue with the reduction of transistor dimensions and spacing. Although many techniques for avoiding the risk of latchup have been developed, they generally apply to spe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ae5dfdbeaf2760092be27f0fc769beb
https://doi.org/10.31399/asm.edfa.2004-3.p020
https://doi.org/10.31399/asm.edfa.2004-3.p020
Autor:
Alan J. Weger, Philip Tung Wu, Pia Naoko Sanda, Steve Wilson, Moyra K. McManus, Mujahid Muhammad, Franco Stellari, Peilin Song, Robert J. Gauthier, Kiran V. Chatty
Publikováno v:
Microelectronics Reliability. 43:1603-1608
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c80196e7276b5e706843a6679f09dc4
https://doi.org/10.1016/s0026-2714(03)00281-6
https://doi.org/10.1016/s0026-2714(03)00281-6
Autor:
Moyra K. McManus, Romain Desplats, Felix Beaudoin, Peilin Song, Alan J. Weger, A. Eral, Franco Stellari, Philippe Perdu
Publikováno v:
Microelectronics Reliability. 43:1663-1668
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::035a08079e04d5926cb232f740a29202
https://doi.org/10.1016/s0026-2714(03)00300-7
https://doi.org/10.1016/s0026-2714(03)00300-7
Publikováno v:
Microelectronics Reliability. 42:1689-1694
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b9895da52cecd37df8670bf6b54359e
https://doi.org/10.1016/s0026-2714(02)00213-5
https://doi.org/10.1016/s0026-2714(02)00213-5
Autor:
B. Huott, T. McNamara, H.J. Nam, O. Wagner, Yuen Chan, Franco Stellari, Peilin Song, J. Eckhardt, Ching-Lung Tong, Moyra K. McManus, Richard F. Rizzolo, Uma Srinivasan, Alan J. Weger
Publikováno v:
ITC
In this paper, we describe an advanced optical diagnostic technique used for diagnosing the IBM z990 eServer microprocessor (Slegel et al., 2004). Time-to-market pressure demands quick diagnostic turnaround time and high diagnostic resolution while t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68c6176ebd680711ba65985b485f53a0
https://doi.org/10.1109/test.2005.1584091
https://doi.org/10.1109/test.2005.1584091
Autor:
Alan J. Weger, Peilin Song, Peter E. Cottrell, Franco Stellari, Mujahid Muhammad, Kiran V. Chatty, Moyra K. McManus, Robert J. Gauthier
Publikováno v:
2004 IEEE International Reliability Physics Symposium. Proceedings.
An analytical model has been developed to provide physical design guidelines to suppress CDE-induced latchup in CMOS ICs. The design guidelines implemented in two test chips in IBM's 130nm technology successfully suppressed latchup against transient
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c7789940c1b4f72754f6402eb8b66b3f
https://doi.org/10.1109/relphy.2004.1315313
https://doi.org/10.1109/relphy.2004.1315313
Autor:
Kiran V. Chatty, Peilin Song, Mujahid Muhammad, Moyra K. McManus, Alan J. Weger, Robert J. Gauthier, Pia Naoko Sanda, Franco Stellari
Publikováno v:
ITC
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] test chip, which was designed in a flip-chip package. Case studies of sev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08fd33540e1b94a1e98ad05a111b347f
https://doi.org/10.1109/test.2003.1270845
https://doi.org/10.1109/test.2003.1270845
Autor:
Franco Stellari, Peilin Song, Pia Naoko Sanda, Steven H. Voldman, Moyra K. McManus, Alan J. Weger
Publikováno v:
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
This paper will demonstrate the synthesis of the high current pulse source method (e.g. used in transmission line pulse (TLP) systems) and the Picosecond Imaging Circuit Analysis (PICA) tool for the evaluation. of electrostatic discharge (ESD) and la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::529245aa5524c2660a9b2b90cb61c309
https://doi.org/10.1109/relphy.2003.1197727
https://doi.org/10.1109/relphy.2003.1197727