Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Movva HCP"'
Autor:
Nibhanupudi SST; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Roy A; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Department of Physics, Birla Institute of Technology Mesra, Ranchi, Jharkhand 835215, India., Chowdhury S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Schalip R; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Coupin MJ; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Matthews KC; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Alam MH; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Satpati B; Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, 1/AF, Bidhannagar, Kolkata 700 064, India., Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Luth CJ; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Wu S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Warner JH; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 May 01; Vol. 16 (17), pp. 22326-22333. Date of Electronic Publication: 2024 Apr 18.
Autor:
Wu D; Department of Physics , The University of Texas at Austin , Austin , Texas 78712 , United States., Li W; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Rai A; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Wu X; Department of Physics , The University of Texas at Austin , Austin , Texas 78712 , United States., Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Yogeesh MN; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Chu Z; Department of Physics , The University of Texas at Austin , Austin , Texas 78712 , United States., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Akinwande D; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Lai K; Department of Physics , The University of Texas at Austin , Austin , Texas 78712 , United States.
Publikováno v:
Nano letters [Nano Lett] 2019 Mar 13; Vol. 19 (3), pp. 1976-1981. Date of Electronic Publication: 2019 Feb 21.
Autor:
Kim K; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Prasad N; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Burg GW; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Wang Y; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Larentis S; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Taniguchi T; National Institute for Materials Science , 1-1 Namiki , Tsukuba , Ibaraki 305-0044 , Japan., Watanabe K; National Institute for Materials Science , 1-1 Namiki , Tsukuba , Ibaraki 305-0044 , Japan., Register LF; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Tutuc E; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States.
Publikováno v:
Nano letters [Nano Lett] 2018 Sep 12; Vol. 18 (9), pp. 5967-5973. Date of Electronic Publication: 2018 Aug 24.
Autor:
Banu N; Department of Materials Science, Indian Association for the Cultivation of Science, 2A & 2B Raja S. C. Mullick Road, Jadavpur, Kolkata-700032, India., Singh S, Basu S, Roy A, Movva HCP, Lauter V, Satpati B, Dev BN
Publikováno v:
Nanotechnology [Nanotechnology] 2018 May 11; Vol. 29 (19), pp. 195703. Date of Electronic Publication: 2018 Feb 20.
Autor:
Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Lovorn T; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, USA., Fallahazad B; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Larentis S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Kim K; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Taniguchi T; National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan., Watanabe K; National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., MacDonald AH; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, USA., Tutuc E; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2018 Mar 09; Vol. 120 (10), pp. 107703.
Autor:
Park JH; Center for Quantum Nanoscience, Institute for Basic Science (IBS), Seoul 03760, Republic of Korea.; Department of Physics, Ewha Womans University, Seoul 03760, Republic of Korea.; Materials Science and Engineering Program, University of California, San Diego, La Jolla, CA 92093, USA., Sanne A; Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX 78712, USA., Guo Y; College of Engineering, Swansea University, Swansea, UK., Amani M; Electrical Engineering and Computer Sciences, University of California at Berkeley, Berkeley, CA 94720, USA., Zhang K; Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA 16802, USA., Movva HCP; Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX 78712, USA., Robinson JA; Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA 16802, USA., Javey A; Electrical Engineering and Computer Sciences, University of California at Berkeley, Berkeley, CA 94720, USA., Robertson J; Department of Engineering, University of Cambridge, Cambridge CB2 1TN, UK., Banerjee SK; Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX 78712, USA., Kummel AC; Materials Science and Engineering Program, University of California, San Diego, La Jolla, CA 92093, USA.; Departments of Chemistry and Biochemistry, University of California, San Diego, La Jolla, CA 92093, USA.
Publikováno v:
Science advances [Sci Adv] 2017 Oct 20; Vol. 3 (10), pp. e1701661. Date of Electronic Publication: 2017 Oct 20 (Print Publication: 2017).
Autor:
Trivedi T; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Roy A; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Walker ES; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Bank SR; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Neikirk DP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States.
Publikováno v:
ACS nano [ACS Nano] 2017 Jul 25; Vol. 11 (7), pp. 7457-7467. Date of Electronic Publication: 2017 Jul 14.
Autor:
Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Fallahazad B; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Kim K; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Larentis S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Taniguchi T; National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan., Watanabe K; National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA., Tutuc E; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2017 Jun 16; Vol. 118 (24), pp. 247701. Date of Electronic Publication: 2017 Jun 15.
Autor:
Larentis S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Fallahazad B; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Kim K; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Rai A; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Taniguchi T; National Institute for Materials Science , 1-1-Namiki, Tsukuba, Ibaraki 305-0044, Japan., Watanabe K; National Institute for Materials Science , 1-1-Namiki, Tsukuba, Ibaraki 305-0044, Japan., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Tutuc E; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States.
Publikováno v:
ACS nano [ACS Nano] 2017 May 23; Vol. 11 (5), pp. 4832-4839. Date of Electronic Publication: 2017 Apr 17.