Zobrazeno 1 - 10
of 193
pro vyhledávání: '"Mourad Idir"'
Autor:
Tianyi Wang, Lei Huang, Xiaolong Ke, Yi Zhu, Heejoo Choi, Weslin Pullen, Vipender Negi, Daewook Kim, Mourad Idir
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 1, Pp 65-75 (2023)
Grazing-incidence reflective optics are commonly used in synchrotron radiation and free-electron laser facilities to transport and focus the emitted X-ray beams. To preserve the imaging capability at the diffraction limit, the fabrication of these op
Externí odkaz:
https://doaj.org/article/6fb1fb511bab4846813e263e66695341
Autor:
Dieter K. Schneider, Alexei S. Soares, Edwin O. Lazo, Dale F. Kreitler, Kun Qian, Martin R. Fuchs, Dileep K. Bhogadi, Steve Antonelli, Stuart S. Myers, Bruno S. Martins, John M. Skinner, Jun Aishima, Herbert J. Bernstein, Thomas Langdon, John Lara, Robert Petkus, Matt Cowan, Leonid Flaks, Thomas Smith, Grace Shea-McCarthy, Mourad Idir, Lei Huang, Oleg Chubar, Robert M. Sweet, Lonny E. Berman, Sean McSweeney, Jean Jakoncic
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 6, Pp 1480-1494 (2022)
The highly automated macromolecular crystallography beamline AMX/17-ID-1 is an undulator-based high-intensity (>5 × 1012 photons s−1), micro-focus (7 µm × 5 µm), low-divergence (1 mrad × 0.35 mrad) energy-tunable (5–18 keV) beamline at the N
Externí odkaz:
https://doaj.org/article/9ae0ab70fdfe42bbb5a06579560bc6d7
Study of interface reaction in a B4C/Cr mirror at elevated temperature using soft X-ray reflectivity
Autor:
Mohammed H. Modi, Shruti Gupta, Praveen K. Yadav, Rajkumar Gupta, Aniruddha Bose, Chandrachur Mukherjee, Philippe Jonnard, Mourad Idir
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 4, Pp 978-984 (2022)
Boron carbide is a prominent material for high-brilliance synchrotron optics as it remains stable up to very high temperatures. The present study shows a significant change taking place at 550°C in the buried interface region formed between the Cr a
Externí odkaz:
https://doaj.org/article/439cea6db34746d5868804eb25fc6c08
Publikováno v:
Frontiers in Physics, Vol 10 (2022)
Soft X-ray off-axis elliptical mirrors bring new challenges for X-ray mirror metrology. These highly asymmetrically curved elliptical cylindrical mirrors with a total slope range >10 mrad are extremely challenging to measure. Their total slope range
Externí odkaz:
https://doaj.org/article/8604977be7c44cd3a3bf7844cd777cbf
Autor:
Weslin C. Pullen, Tianyi Wang, Heejoo Choi, Xiaolong Ke, Vipender S. Negi, Lei Huang, Mourad Idir, Daewook Kim
Publikováno v:
Photonics, Vol 10, Iss 3, p 286 (2023)
Over the past few decades, computer-controlled optical surfacing (CCOS) systems have become more deterministic. A target surface profile can be predictably achieved with a combination of tools of different sizes. However, deciding the optimal set of
Externí odkaz:
https://doaj.org/article/5b079e1302514e7cb4d137f9aa72bdaa
Autor:
Tianyi Wang, Lei Huang, Hyukmo Kang, Heejoo Choi, Dae Wook Kim, Kashmira Tayabaly, Mourad Idir
Publikováno v:
Scientific Reports, Vol 10, Iss 1, Pp 1-12 (2020)
Abstract With the rapid evolution of synchrotron X-ray sources, the demand for high-precision X-ray mirrors has greatly increased. Single nanometer profile error is required to keep imaging capability at the diffraction limit. Ion Beam Figuring (IBF)
Externí odkaz:
https://doaj.org/article/a1b82a51f04d41bf9ba9e67a4663ca66
Publikováno v:
Sensors, Vol 22, Iss 10, p 3940 (2022)
X-ray optics are extensively used in synchrotron radiation and free-electron laser facilities, as well as in table-top laboratory sources [...]
Externí odkaz:
https://doaj.org/article/8b245fc8756b4a5ea8d4276a2b9a9a24
Autor:
Ombeline de La Rochefoucauld, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Lei Huang, Xavier Levecq, Martin Piponnier, Philippe Zeitoun
Publikováno v:
Sensors, Vol 21, Iss 3, p 874 (2021)
For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Elec
Externí odkaz:
https://doaj.org/article/da53574d5a9e44ba884bbca6e9c3384b
Autor:
Tianyi Wang, Xiaolong Ke, Lei Huang, Vipender Negi, Heejoo Choi, Wesllin Pullen, Daewook Kim, Yi Zhu, Mourad Idir
Publikováno v:
Journal of Manufacturing Processes. 87:97-105
Autor:
Ombeline de La Rochefoucauld, Ginevra Begani Provinciali, Alessia Cedola, Philip K. Cook, Francesca Di Lillo, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Xavier Levecq, Laura Oudjedi, Tan-Binh Phan, Martin Piponnier, Giuliana Tromba, Philippe Zeitoun
Publikováno v:
Nondestructive Testing and Evaluation. 37:707-720